A new optoelectronic measurement system for a high-temperature dilatometer for measuring the thermal expansion of solid samples over a wide temperature range from 1000–3000 K is described. A new method is proposed for measuring the elongation of a sample with corrections for the system parameters during the measurement process. Experimental results are reported.
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Translated from Izmeritel’naya Tekhnika, No. 12, pp. 38–42, December, 2015.
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Bronshtein, I.G., Inochkin, F.M., Kruglov, S.K. et al. Optoelectronic Measurement System for a High-Temperature Dilatometer. Meas Tech 58, 1347–1353 (2016). https://doi.org/10.1007/s11018-016-0897-1
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DOI: https://doi.org/10.1007/s11018-016-0897-1