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Investigation of a microstrip sensor on coplanar comb structures with capacitive connectors

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Measurement Techniques Aims and scope

Abstract

A microstrip sensor on coplanar comb structures with capacitive connectors is analyzed. It is shown that it is possible to use such a sensor as part of radio-wave transducers to measure and monitor the gaps or metallization thickness on dielectric substrates.

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Translated from Izmeritel’naya Tekhnika, No. 12, pp. 50–52, December 2005.

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Pchel’nikov, Y.N., Elizarov, A.A. & Lebedeva, T.A. Investigation of a microstrip sensor on coplanar comb structures with capacitive connectors. Meas Tech 48, 1222–1226 (2005). https://doi.org/10.1007/s11018-006-0049-0

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  • DOI: https://doi.org/10.1007/s11018-006-0049-0

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