Abstract
The thermal degradation of an epoxy system consisting of a diglycidyl ether of bisphenol A (DGEBA, n=0) and m-xylylenediamine (m-XDA) was studied by both thermogravimetric analysis (TG) and dielectric analysis (DEA). It has been checked a deviation of the typical behaviour in the Arrhenius plot expected for this kind of systems, owing to the thermal degradation.
Both, structural relaxation time and conductivity values, were represented as a function of the mass loss, that allow a relationship to be obtained between characteristic relaxation time and the degree of degradation at the beginning of the degradation process.
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Núñez-Regueira, L., Villanueva, M., Fraga, I. et al. Influence of the thermal degradation on the dielectric properties of a thermoset. J Therm Anal Calorim 86, 235–241 (2006). https://doi.org/10.1007/s10973-005-7190-x
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DOI: https://doi.org/10.1007/s10973-005-7190-x