Abstract
Mullite Bi2Fe4O9 thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates by using a chemical solution deposition method. The deposited Bi2Fe4O9 thin films were annealed at a series of temperatures in the range 700–850 °C in an oxygen atmosphere using a rapid thermal annealing process. The effect of the annealing temperature on the structural, electrical and multiferroic properties of the Bi2Fe4O9 thin films was investigated. The results showed that the Bi2Fe4O9 thin film that was annealed at 800 °C exhibits a well-crystallized orthorhombic phase with the complete absence of secondary phases, in marked contrast to the thin films that were annealed at 700, 750, and 850 °C for which the formation of secondary phases was observed. Moreover, the Bi2Fe4O9 thin film that was annealed at 800 °C was found to exhibit a low leakage current density and enhanced multiferroic properties, both of which are indicative of the formation of a pure mullite phase with a stable structure.
Similar content being viewed by others
References
Murshed MM, Nénert G, Burianek M, Robben L, Mühlberg M, Schneider H, Fischer RX, Gesing TM (2013) J Solid State Chem 197:370–378
Liu ZS, Wu BT, Yin DG, Zhu YB, Wang LG (2012) J Mater Sci 47:6777–6783
Tian ZM, Qiu Y, Yuan SL, Wu MS, Huo SX, Duan HN (2010) J Appl Phys 108:064110
Miao JH, Fang TT, Chung HY, Yang CW (2009) J Am Ceram Soc 92:2762–2764
Singh AK, Kaushik SD, Kumar B, Mishra PK, Venimadhav A, Siruguri V, Patnaik S (2008) Appl Phys Lett 92:132910
Shamir N, Gurewitz E, Shaked H (1978) Acta crystallogr A 34:662–666
Tian ZM, Yuan SL, Wang XL, Zheng XF, Yin SY, Wang CH, Liu L (2009) J Appl Phys 106:103912
Raghavan CM, Kim JW, Ji YC, Kim SS (2014) Ceram Int 40:14165–14170
Iliev MN, Litvinchuk AP, Hadjiev VG, Gospodinov MM, Skumryev V, Ressouche E (2010) Phys Rev B 81:024302
Friedrich A, Biehler J, Morgenroth W, Wiehl L, Winkler B, Hanfland M, Tolkiehn M, Burianek M, Muhlberg M (2012) J Phys Condens Matter 24:145401
Lahmar A, Zhao K, Habouti S, Dietze M, Solterbeck CH, Es-Souni M (2011) Solid State Ion 202:1
Simões AZ, Riccardi CS, Santos MLD, Garcia FG, Longo E, Varela JA (2009) Mater Res Bull 44:1747–1752
Chiu FC (2014) Adv Mater Sci Eng 578168:1–18
Zatsiupa AA, Bashkirov LA, Troyanchuk IO, Petrov GS, Galyas AI, Lobanovskii LS, Trukhanov SV, Sirota IM (2013) Inorg Mater 49:616–620
White JS, Bator M, Hu Y, Luetkens H, Stahn J, Capelli S, Das S, Döbeli M, Lippert Th, Malik VK, Martynczuk J, Wokaun A, Kenzelmann M, Niedermayer Ch, Schneider CW (2013) Phys Rev Lett 111:037201
Zhang Q, Gong W, Wang J, Ning X, Wang Z, Zhao X, Ren X, Zhang Z (2011) J Phys Chem C 115:25241–25246
Acknowledgments
This work was supported by the Priority Research Centers Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (2010-0029634).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Raghavan, C.M., Kim, J.W., Kim, S.S. et al. Effect of the annealing temperature on the structural and multiferroic properties of mullite Bi2Fe4O9 thin films. J Sol-Gel Sci Technol 73, 403–409 (2015). https://doi.org/10.1007/s10971-014-3547-6
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10971-014-3547-6