Abstract
Ferroelectric thin films of Nd and Mn co-doped bismuth titanate, Bi3.15Nd0.85Ti3−x Mn x O12 (BNTM) (x = 0–0.1), were fabricated on Pt/TiO2/SiO2/Si(100) substrates by a sol–gel technique. The BNTM films had a polycrystalline perovskite structure and uniform and dense surface morphologies. A lattice distortion was observed in the BNTM films due to Mn ion doping. The ferroelectric measurement of the films indicated that the values of coercive field (E c ) decreased gradually with the increase of the Mn content (x), however, the remanent polarization (P r ) increase firstly and then decrease with the increase of x. The sample with x = 0.05 had optimum electrical properties and a maximum 2P r value. The 2P r and 2E c values of the film at a maximum applied electric field of 400 kV/cm were 38.3 μC/cm2 and 180 kV/cm, respectively. Moreover, this BNTM capacitors did not show fatigue behaviors after 1.0 × 1010 switching cycles at a frequency of 1 MHz, suggesting a fatigue-free character. The main reason for the increase of the 2P r and the decrease of the 2E c might be attributed to the lattice distortion in BNTM films due to Mn ion doping.
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Acknowledgements
This work was supported by the National Key Basic Research and Development Program of China (Grant No. 2006CB932305) and the National Natural Science Foundation of China (Grant No. 50872097).
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Pei, L., Li, M., Liu, J. et al. Preparation and electrical properties of Nd and Mn co-doped Bi4Ti3O12 thin films. J Sol-Gel Sci Technol 53, 193–198 (2010). https://doi.org/10.1007/s10971-009-2077-0
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DOI: https://doi.org/10.1007/s10971-009-2077-0