Abstract
The thin films of mixture of xBiFeO3-(1 − x)Bi4Ti3O12 (x = 0.4, 0.5, and 0.6) system were prepared by a sol–gel process. The thicknesses of the thin films were 540, 500, and 570 nm, respectively. The crystal structure of all thin films annealed at 650 °C was analyzed by X-ray diffraction. It was found that the thin films at x = 0.4 and 0.5 mainly consisted of a Bi4Ti3O12 phase while Bi5Ti3FeO15 was the major phase of the thin film at x = 0.6. The thin film (x = 0.6) showed better ferroelectric properties in remnant polarization and polarization fatigue than those observed in the thin films (x = 0.4 and 0.5). The values of remnant polarization 2P r and coercive field 2E c of the thin film at x = 0.6 were 36 μC/cm2 and 192 kV/cm at an applied electric field of 260 kV/cm, respectively. There was almost no polarization fatigue up to 1010 switching cycles. Also weak ferromagnetism was observed in the thin film at x = 0.6.
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References
Watanabe T, Funakubo H (2006) J Appl Phys 100:051602
Paz de Araujo CA, Cuchiaro JD, McMillan LD, Scott MC, Scott JF (1995) Nature 374:627
Cummins SE, Cross LE (1968) J Appl Phys 39:2688
Spaldin NA, Fiebig M (2005) Science 309:391
Fiebig M (2005) J Phys D Appl Phys 38:R123
Nan C-W, Bichurin MI, Dong S, Viehland D, Srinivasan G (2008) J Appl Phys 103:031101
Ramesh R, Spaldin NA (2007) Nat Mater 6:21
Nakashima S, Nakamura Y, Yun K-Y, Okuyama M (2007) Jpn J Appl Phys 46:6952
Dong XM, Wang KF, Wan JG, Zhu JS, Liu J-M (2008) J Appl Phys 103:094101
Zhang S-T, Chen Y-F, Liu Z-G, Ming N-B, Wang J, Cheng G-X (2005) J Appl Phys 97:104106
Ederer C, Spaldin NA (2005) Phys Rev B 71:060401(R)
Moriya T (1960) Phys Rev 120:91
Acknowledgments
This work was supported by the Korea Research Foundation Grant funded by the Korean Government (MOEHRD) (KRF-2007-412-J00901).
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Jo, H.K., Kim, S.S. & Do, D. Fabrication and properties of xBiFeO3-(1 − x)Bi4Ti3O12 system by sol–gel process. J Sol-Gel Sci Technol 49, 336–340 (2009). https://doi.org/10.1007/s10971-008-1868-z
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DOI: https://doi.org/10.1007/s10971-008-1868-z