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Structure, ferroelectric and aging properties of xBi4Ti3O12- (1-x)BiFe0.98Mn0.02O3 films

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Abstract

xBi4Ti3O12-(1-x)BiFe0.98Mn0.02O3 (x = 0, 0.1, 0.2, 0.3, 0.4, 0.5; named BTBF-x) solid solution films were fabricated using the sol–gel method and deposited on FTO/glass substrates. The effects of different solid solution ratios on the structure of BTBF-x films and ferroelectric characteristics were examined. The results showed that the proper composite ratio could meliorate the properties of BTBF-x thin films. The crystal structures of the thin film samples with different compounding ratios regularly changed. All BTBF-x samples had a denser surface and good crystallization properties, the particles were smooth particles with regular shapes, and no evident cracks were found. The 0.3BIT-0.7BFMO sample had the lowest Fe2+ content and oxygen vacancy concentration. At the electric field of 260 kV/cm, this sample also had good ferroelectricity (2Pr = 31.7 μC/cm2) with the lowermost leakage current density (J = 3.9 × 10–6 A/cm2), and the main conduction mechanism was the ohmic conduction mechanism. The relative permittivity(εr) was measured to be 200.3, and this sample exhibited excellent anti-aging properties.

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Acknowledgements

This work was supported by Shandong Provincial Natural Science Fund (ZR2022ME071).

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Authors and Affiliations

  1. School of Materials Science and Engineering, Shandong Jianzhu University, Jinan, 250101, Shandong, China

    Jingxian He, Yan Liu, Yuan Liu, Zhen Jiang, Shuhui Sun, Zhenfeng Jing & Fengqing Zhang

  2. School of Civil Engineering, Shandong Jianzhu University, Jinan, 250101, China

    Jiwei Wang

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  3. Yan Liu
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Contributions

JXH: Writing-review & editing, Writing-original draft, Methodology, Formal analysis. JWW: Data curation, Software. YL: Resources, Software. YL: Resources. ZJ: Software. SHS: Investigation. ZFJ: Investigation. FQZ: Visualization, Supervision, Project ministration, Funding acquisition.

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Correspondence to Fengqing Zhang.

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He, J., Wang, J., Liu, Y. et al. Structure, ferroelectric and aging properties of xBi4Ti3O12- (1-x)BiFe0.98Mn0.02O3 films. J Mater Sci: Mater Electron 35, 304 (2024). https://doi.org/10.1007/s10854-024-12070-0

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