Abstract
The operational parameters of an alpha spectrometer equipped with a planar silicon semiconductor detector were characterized by measuring a mixed alpha source. The full width at half maximum (FWHM) decreased with increasing conversion gain (CG) and sample-to-detector distance (SDD) and was constant beyond an SDD of 21 mm. Although the FWHM was minimum at 4096 CG, peak-shape analysis showed that 1024 CG and 2048 CG are more appropriate than 4096 CG for alpha spectrum analysis. In practical measurement with SDD less than 5 mm, a sample thickness difference of 1 mm caused a relative error in detection efficiency of 11 %.
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This study was supported by the Korea Atomic Energy Research Institute (KAERI) R&D Program of the Ministry of Science and ICT of Korea (521510-21).
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Ryu, J., Park, Jy., Lee, HW. et al. Experimental characterization of alpha spectrometer for optimization of operational parameters affecting energy resolution and detection efficiency. J Radioanal Nucl Chem 329, 959–967 (2021). https://doi.org/10.1007/s10967-021-07821-w
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DOI: https://doi.org/10.1007/s10967-021-07821-w