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Improving the analytical sensitivity of alpha-emitting impurities in grinding high purity silica

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Abstract

The source of contaminating high purity silica during grinding process and analytical sensitivity of alpha-emitting impurities have been investigated. To improve the analytical sensitivity for alpha-emitting impurities in grinding high purity silica, a new procedure was studied by employing an irradiation facility in the hydraulic transfer system (HTS) and the nitrogen flushing system. The source of silica contamination was found to be attributed mostly to alumina balls. The detection limit of U and Th in 3N-grade silica samples by neutron activity analysis (NAA) could be improved to a sub-ng/g level. The contamination rates of Th, U, Cl, Fe and Na from the alumina balls were calculated to be 95%, 15%, 15% and 3.5%, respectively.

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Authors and Affiliations

  1. Korea Institute of Geoscience and Mineral Resources, 30 Gajeong-dong, Yuseong-gu, Daejeon, 305-350, Korea

    Kil Yong Lee, Yoon Yeol Yoon, Soo Young Cho & Yongje Kim

Authors
  1. Kil Yong Lee
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  2. Yoon Yeol Yoon
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  3. Soo Young Cho
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  4. Yongje Kim
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Correspondence to Kil Yong Lee.

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Lee, K.Y., Yoon, Y.Y., Cho, S.Y. et al. Improving the analytical sensitivity of alpha-emitting impurities in grinding high purity silica. J Radioanal Nucl Chem 276, 113–118 (2008). https://doi.org/10.1007/s10967-007-0418-4

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  • DOI: https://doi.org/10.1007/s10967-007-0418-4

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