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On the application of two-dimensional correlation spectroscopy to analyze X-ray photoelectron spectroscopic data

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Abstract

The present work focuses on the analysis of X-ray photoelectron spectroscopic (XPS) data by two-dimensional correlation spectroscopy (2D-COS). While it is not useful to perform the generalized form of the 2D-COS analysis on the survey spectra, the later could be used to correlate different regions of the spectra with each other. This correlation leads to useful qualitative information, which is consistent with the underlying physics and chemistry of the studied process and related to the mechanism of perturbation effects on the materials. In addition, the effects of the probing incident X-ray beam on the measured samples are explored. Depending on the chemical structure and stability of the measured samples, the effects of X-ray beam varied from net charging effect on helium irradiated PEEK to massive change in the surface composition of amorphous and proton irradiated PEEK samples. XPS is a sensitive surface analysis technique, and care must be paid to avoid misleading results in the analysis of polymer samples.

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Acknowledgements

The authors thank Prof. James N. Hay for useful discussion and Prof. David J. Parker for allowing the use of irradiation facility. Thanks are also due to prof. I Othman the DG of the AEC, prof. A. W. Allaf the head of chemistry department and prof. B. Alsafadi the Head of the scientific office for their supports and engorgements. The technical support of Mr. M. Alwaza is also acknowledged.

Funding

Atomic Energy Commission of Syria.

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Authors and Affiliations

  1. Department of Chemistry, Atomic Energy Commission, P.O. Box: 6091, Damascus, Syrian Arab Republic

    Abdul Ghaffar Al Lafi & Mohammed Amer Mougrabya

  2. The Scientific Office, Atomic Energy Commission, P.O. Box: 6091, Damascus, Syrian Arab Republic

    Osama Shehada

Authors
  1. Abdul Ghaffar Al Lafi
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  2. Mohammed Amer Mougrabya
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  3. Osama Shehada
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Contributions

All authors contributed to the study conception and design. Material preparation, data collection and analysis were performed by [Mohammed Amer Mougrabya] and [Osama Shehada]. The first draft of the manuscript was written by [Abdul Ghaffar Al Lafi] and all authors commented on previous versions of the manuscript. All authors read and approved the final manuscript.

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Correspondence to Abdul Ghaffar Al Lafi.

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Al Lafi, A.G., Mougrabya, M.A. & Shehada, O. On the application of two-dimensional correlation spectroscopy to analyze X-ray photoelectron spectroscopic data. J Polym Res 29, 11 (2022). https://doi.org/10.1007/s10965-021-02857-8

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