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Andreev Reflections in Micrometer-Scale Normal Metal-Insulator-Superconductor Tunnel Junctions

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Abstract

Understanding the subgap behavior of Normal metal-Insulator-Superconductor (NIS) tunnel junctions is important in order to be able to accurately model the thermal properties of the junctions. Hekking and Nazarov (Phys. Rev. B 49:6847, 1994) developed a theory in which NIS subgap current in thin-film structures can be modeled by multiple Andreev reflections. In their theory, the current due to Andreev reflections depends on the junction area and the junction resistance area product. We have measured the current due to Andreev reflections in NIS tunnel junctions for various junction sizes and junction resistance area products and found that the multiple reflection theory is in agreement with our data.

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Acknowledgements

This work is supported by the NASA APRA program and a National Research Council Postdoctoral Fellowship.

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Authors and Affiliations

  1. National Institute of Standards and Technology, 325 Broadway MS 817.03, Boulder, CO, 80305, USA

    Peter J. Lowell, Galen C. O’Neil, Jason M. Underwood & Joel N. Ullom

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  1. Peter J. Lowell
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  2. Galen C. O’Neil
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  3. Jason M. Underwood
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  4. Joel N. Ullom
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Correspondence to Peter J. Lowell.

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Lowell, P.J., O’Neil, G.C., Underwood, J.M. et al. Andreev Reflections in Micrometer-Scale Normal Metal-Insulator-Superconductor Tunnel Junctions. J Low Temp Phys 167, 392–397 (2012). https://doi.org/10.1007/s10909-011-0425-2

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  • DOI: https://doi.org/10.1007/s10909-011-0425-2

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