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Uncoupling nanoparticle geometry from material properties for improved hole injection at submonolayer nanoparticle electrode interlayers in organic hole-only devices

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Abstract

We demonstrate enhanced hole injection into organic hole transport layers (HTL) from submonolayer NiOx, SnOx, and LiF nanoparticle hole injection layers (HIL) produced using reverse micelle templating. Decoration of ITO with nanoparticle HIL shifts the hole barrier height at the interface by modifying the electrical structure of the interfacial surface even though the submonolayers show different coverage rates with different sizes and spacing. The current density–voltage characteristics of hole-only devices using nanoparticles are higher than a non-decorated ITO anode, corresponding to the dynamic barrier height shift. Using reverse micelle templating allows the uncoupling of the effect of a non-uniform electric field from nanoscale objects from the impact of the material properties. Larger nanoparticles with greater coverage show less effective injection than smaller particles with low coverage. Using this assessment, a single monolayer of LiF with particles \(\sim\)6 nm, and 21.5% coverage shows the highest hole injection for a single layer of particles, but NiO as a material has greater capacity for hole injection per volume of material on the surface, as particles of \(\sim\)8 nm with only 5.6% coverage can still act to improve charge injection. As this optimal performance is highly dependent on the organic layer and the nature of the contact with respect to trap states, tuning the size and density of the nanoparticle arrays seems to be an effective route to optimizing HILs for novel organic materials in next generation devices.

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Acknowledgements

The authors would also like to thank the McMaster Manufacturing Research Institute (MMRI) and BioInterfaces Institute at McMaster University for access to the AFM and R. Sodhi at the Open Center for the Characterization of Advanced Materials (OCCAM) at the University of Toronto for XPS and UPS measurements. This research was funded by Academic Research Fund of Hoseo University in 2019 (2019-0811) (WYK), and Natural Sciences and Engineering Research Council of Canada (RGPIN-2019-05994), the Ontario Ministry of Research and Innovation (ER15-11-123), and the Satellite Canada Innovation Network (HTSN-621).

Funding

This research was funded by Academic Research Fund of Hoseo University in 2019 (2019-0811) (WYK), and Natural Sciences and Engineering Research Council of Canada (RGPIN-2019-05994), the Ontario Ministry of Research and Innovation (ER15-11-123), and the Satellite Canada Innovation Network (HTSN-621).

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Authors and Affiliations

  1. Department of Engineering Physics, McMaster University, Hamilton, Canada

    Seung Il Lee, Muhammad Munir, Ramis Arbi, Pedro Oliveira & Ayse Turak

  2. Department of Electronic Display Engineering, Hoseo University, Asan, South Korea

    Seok Je Lee & Woo Young Kim

  3. A-PRO Co. Ltd, Gunpo, South Korea

    Jong Hyun Lim

  4. Functional Materials Research Consortium, McMaster University, Hamilton, Canada

    Seung Il Lee, Woo Young Kim & Ayse Turak

  5. Department of Physics, Centre for NanoScience Research, Concordia University, Montreal, Canada

    Seung Il Lee, Muhammad Munir, Ramis Arbi & Ayse Turak

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  1. Seung Il Lee
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Contributions

SIL, WYK, and AT contributed to the study conception and design. Material preparation, data collection, and analysis were performed by SIL, MM, and SJL. The first draft of the manuscript was written by SIL and all authors commented on the previous versions of the manuscript. All authors read and approved the final manuscript.

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Correspondence to Woo Young Kim or Ayse Turak.

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Lee, S.I., Munir, M., Arbi, R. et al. Uncoupling nanoparticle geometry from material properties for improved hole injection at submonolayer nanoparticle electrode interlayers in organic hole-only devices. J Mater Sci: Mater Electron 34, 1101 (2023). https://doi.org/10.1007/s10854-023-10370-5

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