Abstract
Transient liquid phase (TLP) bonding is a diffusion bonding process for joining metals using low temperature. Although, TLP is applicable to power electronics systems intended for high-temperature application, the brittle inter-metallic compounds formed at its inter-phase have low resistance to thermomechanical stresses experienced during the operational life of the device. Laminated TLP (L-TLP) bonding, which uses a preform with ductile core layer, has the potential to mitigate thermally induced stress. L-TLP performance depends on the quality of the preform, as well as processing parameters. However, little emphasis has been dedicated to the characterization of the preform and bond performance. In this work, variations in fabrication process and surface roughness were assessed in terms of final bond quality for varying core layer thicknesses. Scanning electron microscopy (SEM), confocal scanning acoustics microscopy (CSAM), energy dispersive x-ray (EDX) and shear tests were used to evaluate the bond quality. Two preform fabrication processes comprising of electro-cleaning-dilute nitric acid-zincate (EHdZ) and alcohol-concentrated nitric acid-zincate (AHcZ) were considered. The results show that AHcZ produces superior performance. In addition, it is found that a rougher core layer resulted in better adhesion of plated layers. The bond shear force exceeded the relevant MIL-STD 883 acceptable threshold of 2.5 kg for shear area greater than 4.12 mm2 for core layers of 38 and 76 μm. Numerical simulation using ANSYS shows, that L-TLP bond, with thinner core layer thickness resulted in in higher thermally induced stress at the intermetallic compound (IMC) layer.
Similar content being viewed by others
Data availability
The authors declares that this paper is an original work. Data will be made available on request.
References
B. Mouawad, R. Skuriat, J. Li, C.M. Johnson, DiMarino C. (2018) IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD). IEEE 256–259
S. Jones-Jackson, R. Rodriguez, A. Emadi, IEEE Trans. Power Electron. 36(9), 10420–10435 (2021)
H. Chen et al., Feasibility design of tight integration of low inductance SiC power module with microchannel cooler, 2022 IEEE Applied power electronics conference and exposition (APEC), 962–965
C. Peng, W. Zhu, P. Ke, R. Li, X. Dai, L. Wang, IEEE Journal of emerging and selected topics in power electronics, 2022
J. Harris and D. Huitink, "Investigation of Transient Liquid Phase Bonding to Low Temperature Co-fired Ceramic Substrates," 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm), (San Diego, CA, USA, 2022), pp. 1–4. https://doi.org/10.1109/iTherm54085.2022.9899666
Y. Liu, S.N. Joshi, E.M. Dede, J. Electron. Packaging 142(1), 011003 (2022)
M. Knoerr, A. Schletz Sixth international conference on integrated power electronics systems (CIPS), Nuremberg, Germany, (2010), 1–6
P. Ning, T.G. Lei, F. Wang, G.-Q. Lu, K.D. Ngo, K. Rajashekara, IEEE Trans. Power Electron. 25(8), 2059–2067 (2010)
H. Kang, A. Sharma, J.P. Jung, Metals 10(7), 934 (2020)
D.H. Jung, A. Sharma, M. Mayer, J.P. Jung, Rev. Adv. Mater. Sci. 53(2), 147–160 (2018)
C.J. Leinenbach, Electron. Mater. 44, 4576–4588 (2015)
N.S. Nobeen, R. Imade, B. Lee, E. Phua, C. Wong, Gan, C. IEEE 15th Electronics Packaging Technology Conference, Singapore, (2013), 11–13
B. Liu, Y. Tian, J. Feng, C. Wang, J. Mater. Sci. 52, 1943 (2017)
A.S. Khaja, C. Kaestle, A. Reinhardt, Franke J. 36th International Spring Seminar on Electronics Technology, Alba Iulia, Romania, (2013), 11
O. Mokhtari, H. Nishikawa, Adv. Powder Technol. 27, 1000–1005 (2016)
H. Ji, M. Li, S. Ma, M. Li, Mater. Des. 108, 590–596 (2016)
T. Hu, H. Chen, M. Li, Mater. Des. 108, 383–390 (2016)
S.W. Yoon, M.D. Glover, K. Shiozaki, IEEE Trans. Power Electron. 28(5), 2448–2456 (2013)
Y. Liu, S.N. Joshi, Dede. E. M. IEEE 69th Electronic components and technology conference (ECTC). (2019), 1437–1442
H.B. Song, S.K. Song, H.Y. Seong, S. Injoon, T.K. Kyung, C. Hoyong, Coating 9(3), 213 (2019)
INTERNATIONAL STANDARD ISO 22007-2, Plastics determination of thermal conductivity and thermal diffusivity part 2: transient plane heat source (hot disc) method 2008
K. Seelig, D. Suraski 50th Electronic components and technology conference (Cat. No.00CH37070), Las Vegas, NV, USA, (2000), 1405–1409
Indium Corporation product data sheet, www.indium.com
L. Qu, N. Zhao, H.J. Zhao, M.L. Huang, H.T. Ma, Scripta Mater. 72, 43–46 (2014)
J.F. Li, P.A. Agyakwa, C.M. Johnson, Acta Mater 59(3), 1198–1211.\ (2011)
H. Greve, F.P. McCluskey IEEE International workshop on integrated power packaging (IWIPP), Delft, Netherlands, (2017),1–7
J.J. Yu, J.Y. Wu, L.J. Yu, Kao C.R. IEEE 66th ELectronic components and technology conference (ECTC), 1135–1140
MIL-STD-883G. Die shear strength, method 2019.7 07 March 2003
J.W. Yoon, S.W. Kim, S.B. Jung, Mater. Trans. 45, 727–733 (2004)
E.G. Okafor, D.R. Huitink, J. Electron. Packag. 145(2), 020801 (2023). https://doi.org/10.1115/1.4055774
B.-S. Lee, S.-K. Hyun, J.-W. Yoon, J. Mater. Sci.: Mater. Electron. 28, 7827–7833 (2017)
P. Paret, J. Major, D. DeVoto, S. Narumanchi, C. Ding, G.-Q. Lu, IEEE J. Emerg. Sel. Top. Power Electron. 10(5), 5181–5191 (2022)
H.P.R. Frederikse, R.J. Fields, A. Feldman, J. Appl. Phys. 72, 2879 (1992)
M.A. Hopcropt, W.D. Nix, W.K. Thomas, J. Microelectromech. Syst. 19(2), 229–238 (2010)
I. Todhunter. A history of the theory of elasticity and of the strength of materials, 2 (1886)
Acknowledgements
Funded through the Department of Energy’s Kansas National Security Campus, operated and managed by Honeywell Federal Manufaturing & Technonolgies, LLC under Contract Number DE-NA0002839.
Funding
The authors have not disclosed any funding.
Author information
Authors and Affiliations
Contributions
OEG: Conceptualization, formal analysis, writing—review and editing. JH: Investigation, formal analysis, validation. LM: Sample preparation and data collection. DRH: Conceptualization, writing—review and editing, supervision, funding acquisition.
Corresponding author
Ethics declarations
Competing interests
The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.
Ethical approval
I Ekene Gabriel Okafor on behalf of the authors’, consciously assure that the manuscript entitled laminated transient liquid phase preform and bond characterization for high temperature power electronics application, is the authors’ own original work, which has not been previously published or currently being considered for publication elsewhere. The paper reflects the authors’ own research and analysis in a truthful and complete manner. Meaningful contributions of co-authors and co-researchers are clearly stated. The results are appropriately placed in the context of prior and existing research. All sources used are properly cited. All authors have been personally and actively involved in substantial work leading to the paper, and will take public responsibility for its content. I agree with the above statements and declare that this submission follows the policies of Journal of Materials Science: Materials in Electronics as outlined in the submission guidelines and in the Compliance with Ethical Standards.
Additional information
Publisher’s Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
About this article
Cite this article
Okafor, E.G., Harris, J., Marshall, L. et al. Laminated transient liquid phase preform and bond characterization for high-temperature power electronics application. J Mater Sci: Mater Electron 34, 891 (2023). https://doi.org/10.1007/s10854-023-10266-4
Received:
Accepted:
Published:
DOI: https://doi.org/10.1007/s10854-023-10266-4