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X-ray Pole figure analysis for orienting TGSM grown bulk ZnTe crystal for Terahertz device applications

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Abstract

ZnTe crystal is an electro-optical crystal which is extensively utilized for Terahertz generation and detection in various spectroscopic, surveillance and defence applications. Precise orientation of ZnTe bulk crystal along (110) is very important for obtaining maximum terahertz response from ZnTe crystal. This paper reports growth of ZnTe crystal by temperature gradient solvent method (TGSM) at controlled low temperature ~ 1060 °C with main thrust on the use of X-ray Pole figure analysis to precisely orient the grown crystal along (110) orientation. The paper elaborates various steps in X-ray Pole figure technique to obtain precise orientation corrections in the form of crystal tilt and rotation values for the unoriented cut wafer providing adequate explanation on the interpretation and analysis of X-ray Pole figure data. Required (110) orientation of the oriented cut ZnTe crystal wafer is ascertained by X-ray pole figure and X-ray diffraction analysis. Both unoriented and (110) oriented ZnTe crystal wafers are analysed by Resonant Raman spectroscopy to study the effect of precise orientation on Raman scattering. Intensity of longitudinal optic multiphonon peaks in the resonant Raman spectra are enhanced in the (110) oriented ZnTe wafer. Finally, terahertz spectroscopy of (110) ZnTe is performed to evaluate the terahertz response of fabricated (110) ZnTe substrates which shows a high transmittance (~ 70%) in the terahertz region and very strong electro-optic terahertz detection which is attributed to controlled low-temperature growth and precise orientation cutting along <110> direction of ZnTe crystal.

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The data that support the findings of this study will be available on request from the corresponding author.

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Acknowledgements

The authors would like to thank Dr. Seema Vinayak, Director, Solid State Physics Laboratory, DRDO for her guidance and the permission to publish this work. The authors also express their sincere thanks to Prof. S.S. Prabhu, Tata Institute of Fundamental Research, Mumbai for performing the Terahertz transmission and detection measurements on fabricated ZnTe substrates. Help from other colleagues is also acknowledged.

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Authors and Affiliations

  1. Solid State Physics Laboratory, DRDO, Lucknow Road, Timarpur, New Delhi, 110054, India

    Sudeep Verma, Akhilesh Pandey, Sandeep Dalal, Meenakshi Srivastava & R. Raman

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  1. Sudeep Verma
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  2. Akhilesh Pandey
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  3. Sandeep Dalal
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  4. Meenakshi Srivastava
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Contributions

SV: Conceptualization, Visualization, Writing-Original draft preparation AP: Conceptualization, Visualization, Writing-Original draft preparation, Writing-Reviewing and Editing, SD: Visualization, Validation, MS: Visualization, Validation, RR: Reviewing and Editing.

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Correspondence to Akhilesh Pandey.

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Verma, S., Pandey, A., Dalal, S. et al. X-ray Pole figure analysis for orienting TGSM grown bulk ZnTe crystal for Terahertz device applications. J Mater Sci: Mater Electron 34, 817 (2023). https://doi.org/10.1007/s10854-023-10230-2

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