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Grain-size dependence of electrical properties in (Na0.5Bi0.5)0.94Ba0.06TiO3 films by PLD

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Abstract

Grain size has significant effects on dielectric and ferroelectric properties of ferroelectric thin film for capacitors applications. In present work, lead-free (Bi0.5Na0.5)0.94Ba0.06TiO3 (BNT-6BT) films with different grain size were deposited on LSMO/Pt(111)/Ti/SiO2/Si(100) substrates by modulating the deposition temperature via pulsed laser deposition (PLD). The structure and grain size with rising deposition temperature were investigated by grazing-angle incidence X-ray diffractometer (GIXRD) and field emission scanning electron microscope (FESEM). Films with pseudocubic structure and average grain sizes variation from 46.5 to 106.0 nm were obtained. The dielectric and ferroelectric properties increase with the average size initially from 46.5 to 106.0 nm and then decrease slightly with a lightly degraded grain size as increasing deposition temperature. The enhanced values of Pmax, Pr, and εr with 35.27 µC/cm2, 13.98 µC/cm2 and 568 at 1 kHz, respectively, are obtained in BNT-6BT films with the average grain size of 106.0 nm. Of particular importance is that BNT-6BT films with appropriate grain size possess superior frequency and anti-fatigue stabilities of ferroelectric properties. The results provide important guidance on the meticulous design of the electrical properties of the BNT-6BT films.

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Data availability

The datasets generated during and/or analyzed during the current study are available from the corresponding author on reasonable request.

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Acknowledgements

This work was supported by Guangxi Natural Science Foundation (AD19245084, 2019GXNSFAA245056), Guangxi Key Laboratory of Information Materials (Grant No.201014-Z, 201005-Z), and the Program for Bagui Scholars of Guangxi, China.

Funding

Funding was provided by Natural Science Foundation of Guangxi Province (AD19245084, 2019GXNSFAA245056). Key Laboratory of Information Materials (201014-Z, 201005-Z).

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Authors and Affiliations

  1. School of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China

    Lin Li, Changrong Zhou, Dongyan Yu, Yuanlei Zheng, Jingtai Zhao & Guanghui Rao

  2. School of Materials Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China

    Lin Li, Changrong Zhou, Yuanlei Zheng, Changlai Yuan, Lei Ma, Shuai Cheng, Jingtai Zhao & Guanghui Rao

  3. Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China

    Lin Li, Changrong Zhou, Yuanlei Zheng, Changlai Yuan, Lei Ma, Shuai Cheng, Jingtai Zhao & Guanghui Rao

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  1. Lin Li
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Contributions

All authors contributed to the study conception and design. Material preparation, data collection and analysis were performed by LL, DY, YZ, and SC. The first draft of the manuscript was written by LL and the manuscript was revised by CZ, and GR. All authors read and approved the final manuscript.

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Correspondence to Changrong Zhou or Guanghui Rao.

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Li, L., Zhou, C., Yu, D. et al. Grain-size dependence of electrical properties in (Na0.5Bi0.5)0.94Ba0.06TiO3 films by PLD. J Mater Sci: Mater Electron 33, 21459–21471 (2022). https://doi.org/10.1007/s10854-022-08937-9

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