Abstract
Nanostructured perovskite LaAlO3 thin films with thickness of 50 nm, 100 nm, and 150 nm were prepared using thermal evaporation technique. The Fourier transform infrared spectroscopy study reveals the presence of La–Al–O bond. X-ray diffraction pattern confirms the perovskite LaAlO3 structure. Scanning electron microscope images show the uniform furry structured rods, mixed rods/cubes and flower structured morphology. The presence of elements like La, Al, and O was confirmed from the energy-dispersive X-ray spectroscopy. Current–voltage (I–V) characteristics of Al/LaAlO3/Al sandwich capacitor structure show the existence of Poole–Frenkel type conduction mechanism with low leakage current (0.75 × 10–7 to 1.5 × 10–7 A/cm2), low activation energy (2.59 to 0.21 eV) and decrease in potential barrier with an increase in the electric field. The acquired results indicated that the prepared LaAlO3 nanothin film could be captivated with utilization as a dielectric layer in various electronic devices in the future.
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References
R.W. Schwartz, Chem. Mater. 9, 2325 (1997)
F.S. Galasso, Structure and Properties of Perovskite Compounds (Pergamon Press, Oxford, 1969)
S. Li, B. Bergman, Z. Zhao, Mater. Chem. Phys. 132, 309 (2012)
S. Ran, L. Gao, Ceram. Int. 34, 443 (2008)
S.Y. Cho, I.T. Kim, K.S. Hong, J. Mater. Res. 14, 114 (1999)
S.N. Koc, F. Oksuzomer, E. Yasar, S. Akturk, M.A. Gurkaynak, Mater. Res. Bull. 41, 2291 (2006)
M. Suzuki, Materials 5, 443 (2012)
K.Z. Fung, T.Y. Chen, Solid State Ion. 188, 64 (2011)
G. Martinelli, M.C. Carotta, M. Ferroni, Y. Sadaoka, E. Traversa, Sens. Actuators. B 55, 99 (1999)
K. Huang, J. Wan, J.B. Goodenough, J. Mater. Sci. 36, 1093 (2001)
D. Kienzle, P. Koirala, L.D. Marks, Surf. Sci. 633, 60 (2015)
Y. Du, C. Wang, J. Li, X. Zhang, F. Wang, Y. Zhu, N. Yin, L. Mei, Comput. Mater. Sci. 99, 57 (2015)
W. Dai, C. Cen, APS March Meeting, Baltimore, Maryland, (2016)
K.A. Brown, S. He, D.J. Eichelsdoerfer, M. Huang, I. Levy, H. Lee, S. Ryu, P. Irvin, J. Mendez-Arroyo, C.B. Eom, C.A. Mirkin, J. Levy, Nat. Commun. 7, 10681 (2016)
G.E.D.K. Prawiroatmodjo, F. Trier, D.V. Christensen, Y. Chen, N. Pryds, T.S. Jespersen, Phys. Rev. B 93, 184504 (2016)
H.L. Hu, R. Zeng, A. Pham, T.T. Tan, Z. Chen, C. Kong, D. Wang, S. Li, ACS Appl Mater. Int. 8, 13630 (2016)
W.M. Lu, S. Saha, X.R. Wang, Z.Q. Liu, K. Gopinadhan, A. Annadi, S.W. Zeng, Z. Huang, B.C. Bao, C.X. Cong, M. Venkatesan, T. Yu, J.M.D. Coey, Ariando, T. Venkatesan, Nat. Commun. 7, 1 (2016)
K.C. Liu, W.H. Tzeng, K.M. Chang, J.J. Huang, Y.J. Lee, P.H. Yeh, P.S. Chen, H.Y. Lee, F. Chen, M.J. Tsai, Thin Solid Films 520, 1246 (2011)
N. Alves, W.B. Ferraz, L.O. Faria, Radiat. Meas. 71, 90 (2014)
Q.Y. Shao, A.D. Li, J.B. Cheng, H.Q. Ling, D. Wu, Z.G. Liu, Y.J. Bao, M. Wang, N.B. Ming, C. Wang, H.W. Zhou, B.Y. Nguyen, Appl. Surf. Sci. 250, 14 (2005)
W. Cai, C. Fu, J. Gao, H. Chen, J. Alloys Compd. 480, 870 (2009)
H. Wong, B.L. Yang, K. Kakushima, P. Ahmet, H. Iwai, Vacuum 86, 929 (2012)
M. Esro, R. Mazzocco, G. Vourlias, O. Kolosov, A. Krier, W.I. Milne, G. Adamopoulos, Appl. Phys. Lett. 106, 203507 (2015)
B. Chandar Shekar, S. Sathish, R. Sathyamoorthy, Int. J. Nanotechnol. Appl. 5, 297 (2011)
L. John Berchmans, S. Angappan, A. Visuvasam, K.B. Ranjith Kumar, Mater. Chem. Phys. 109, 113 (2008)
F. Wrobel, A.F. Mark, G. Christiani, W. Sigle, H.U. Habermeier, P.A. van Aken, G. Logvenov, B. Keimer, E. Benckiser, Appl. Phys. Lett. 110, 041606 (2017)
S. Sugumaran, C.S. Bellan, D. Bheeman, S. Raja, D. Bheeman, R. Rajamani, RSC Adv. 5, 10599 (2015)
S. Sugumaran, C.S. Bellan, D. Bheeman, Opt. Mater. 72, 618 (2017)
S. Sugumaran, C.S. Bellan, M. Dinesh, S. Raja, D. Bheeman, R. Rajamani, Polym. Adv. Technol. 26, 1486 (2015)
S. Sugumaran, M.N.B. Ahmad, M.F. Jamlos, C.S. Bellan, S. Chandran, M. Sivaraj, Opt. Mater. 54, 67 (2016)
R. Skaudzius, A. Zalga, A. Kareiva, Mater. Sci. Medzg. 14, 193 (2008)
K. Nakamoto, Infrared and Raman Spectra of Inorganic and Coordination Compounds (Wiley, New York, 1986)
A.K. Adak, P. Pramanik, Mater. Lett. 30, 267 (1997)
Q. Zhang, F. Saito, J. Am. Ceram. Soc. 83, 439 (2000)
Z. Li, S. Zhang, W.E. Lee, J. Eur. Ceram. Soc. 27, 3201 (2007)
M. Kakihana, T. Okubo, J. Alloys Compd. 266, 129 (1998)
D. Zhou, G. Huang, X. Chen, J. Xu, S. Gong, Mater. Chem. Phys. 84, 33 (2004)
B. Ranjithkumar, S. Sathish, D. Nadaraj, M. Shankar, K.P.B. Dinesh, R. Ranjithkumar, R. Sengodan, M. Ramesh, B. Chandar Shekar, Int. J. Biosci. Nanosci. 1, 28 (2014)
B. Schrader (ed.), Infrared Raman Spectroscopy: Methods and Applications (Wiley-VCH Verlag GmbH, Weinheim, 1995)
J. Chandradass, K.H. Kim, Adv. Powder Technol. 21, 100 (2010)
H.F. Yu, J. Wang, S.S. Wang, Y. Kuo, J. Phys. Chem. Solids 70, 218 (2009)
M.V. Cabanas, C.V. Ragal, F. Conde, J.M. Gonzalez-Calbet, M. Vallet-Ragi, Solid State Ion. 101–103, 191 (1997)
G.W. Berkstresser, A.J. Valentino, C.D. Brandle, J. Cryst. Growth 109, 467 (1991)
F. Blanc, D.S. Middlemiss, L. Buannic, J.L. Palumbo, I. Farnan, C.P. Grey, Solid State Nucl. Magn. Reson. 42, 87 (2012)
A. Nakatsuka, O. Ohtaka, H. Arima, N. Nakayama, T. Mizota, Acta Cryst. E61, i148 (2005)
G.W. Berkstresser, A.J. Valentino, C.D. Brandle, J. Cryst. Growth 128, 684 (1993)
P.K. Sahu, S.K. Behera, S.K. Pratihar, S. Bhattacharyya, Ceram. Int. 30, 1231 (2004)
S.M. Lim, H.W. Yeon, G.B. Lee, M.G. Jin, S.Y. Lee, J. Jo, M. Kim, Y.C. Joo, Sci. Rep. 9, 7872 (2019)
H. Birey, J. Appl. Phys. 49, 2898 (1978)
P.N. Plassmeyer, K. Archila, J.F. Wager, C.J. Page, ACS Appl. Mater. Interf. 7, 1678 (2015)
J.R. Tsai, W.S. Feng, P.H. Chien, K.C. Liu, Thin Solid Films 555, 153 (2014)
Z.Q. Liu, W.K. Chim, S.Y. Chiam, J.S. Pan, C.M. Ng, Thin Solid Films 534, 177 (2013)
W. Schottky, Physikalische Zeitschrigt 15, 872 (1914)
F.C. Chiu, Adv. Mater. Sci. Eng. (2014). https://doi.org/10.1155/2014/578168
S. Wagle, V. Shirodkar, Braz. J. Phys. 30, 380 (2000)
H. Jin, E. Debroye, M.K.G. Scheblykin, M.B.J. Roeffaers, J. Hofkens, J.A. Steele, Mater. Horiz 7, 397 (2020)
J. Frenkel, J. Phys. Rev. 54, 647 (1938)
L.I. Maissel, R. Glang (eds.), Handbook of A, vol. 1 (McGraw-Hill, New York, 1970), pp. 4–29
Q.F. Pan, Q. Liu, Adv. Mater. Sci. Technol. 1690378, 1–9 (2019)
M.S. Bhutta, S. Akram, P. Meng, J. Castellon, S. Agnel, H. Li, Y. Guo, G. Rasool, S. Hussain, M.T. Nazir, Polymers 13, 640 (2021)
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Sugumaran, S., Divya, T.A., Sivaraman, R.K. et al. Structure, morphology and I–V characteristics of thermally evaporated LaAlO3 nanostructured thin films. J Mater Sci: Mater Electron 33, 9085–9100 (2022). https://doi.org/10.1007/s10854-021-07139-z
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DOI: https://doi.org/10.1007/s10854-021-07139-z