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Investigation of structure, dielectrical, optical, and electronic properties for Y0.225Sr0.775CoO3 thin films deposited on different single crystal substrates using pulsed laser deposition (PLD) method

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Abstract

The optical properties of these films were measured using UV/Vis spectrophotometer. The optical parameters; energy gap (Eg), refractive index (n), extinction coefficient (k), the optical energy gap affected strongly by changing the substrate type. Moreover both of oscillating energy (Eo), dispersion energy (Ed), the effective mass of these films with different substrate had been calculated optically, another important parameters, such as the dielectric constant (ε\) and dielectric loss (ε\\) and both of the real part (σ1) and imaginary part (σ2) of optical conductivity were determined. The ratio of VEL to SEL as functions of photon energy for Y0.225Sr0.775CoO3 films was calculated optically. Finally, the density of both valence band (NV) and conduction band (NC) for these films has been calculated. The dielectric constants for these films were determined.

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Authors and Affiliations

  1. Solid State Physics Department, Physical Research Division, National Research Centre (NRC), 33 El Bohouth Street, Dokki, P.O.12622, Giza, Egypt

    A. Abdel Moez

  2. Basic Science Department, Faculty of Faculty of Technology and Education, Helwan University, Kobry El-Qopa, Cairo, 11281, Egypt

    Ahmed I. Ali

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Moez, A.A., Ali, A.I. Investigation of structure, dielectrical, optical, and electronic properties for Y0.225Sr0.775CoO3 thin films deposited on different single crystal substrates using pulsed laser deposition (PLD) method. J Mater Sci: Mater Electron 32, 19275–19283 (2021). https://doi.org/10.1007/s10854-021-06447-8

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