Correction to: Journal of Materials Science: Materials in Electronics (2019) 30:15379–15387 https://doi.org/10.1007/s10854-019-01914-9

In the original version, all the peaks are indexed in all figures expect the two small peaks at 72.08° and 75.54°; they are assigned to the diffraction plane of the hematite phase (1010) and (220) (JCPDS card number 00-001-1053). The peaks located at 71.5° and 74.5° are assigned to the diffraction plans (620) and (533) of the spinel phase, respectively.

The last diffraction peak located at 75.5° in Fig. 1 was wrongly indexed as belonging to hematite. It belongs to the NiO phase.

Fig. 1
figure 1

XRD patterns of α-Fe2O3 and Ni-ferrite (25%, 50% and 75%) nanoparticles