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Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods

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Abstract

Influence of Ti additions in Sb2Te3 thin films on structure and phase stability was studied by experiments together with theoretical calculations. The incorporation of Ti atoms in the Sb2Te3 thin films caused formation of finer grains. By X-ray photoelectron spectroscopy and ab initio calculation, both the Sb and Te atoms are likely to be replaced by the Ti atoms to form Ti–Sb and Ti–Te covalent bonds. It suggests that the Ti atoms locate in Te1 position and interstice of the lattice.

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Acknowledgements

This work was financially supported by National Natural Science Foundation of China (51201178).

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Authors and Affiliations

  1. Shanghai Synchrotron Radiation Facility (SSRF), Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, China

    Ling Zhang

  2. State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China

    Sannian Song, Wei Xi, Le Li & Zhitang Song

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  1. Ling Zhang
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  2. Sannian Song
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  3. Wei Xi
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  4. Le Li
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Correspondence to Ling Zhang or Sannian Song.

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Zhang, L., Song, S., Xi, W. et al. Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods. J Mater Sci: Mater Electron 29, 4704–4710 (2018). https://doi.org/10.1007/s10854-017-8422-0

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  • DOI: https://doi.org/10.1007/s10854-017-8422-0

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