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Structural and optical behaviour of cerium doped TiO2 thin films prepared by spray pyrolysis method

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Abstract

The Cerium doped titanium oxide (CexTi1−xO2 with x = 0 and 0.1) thin films were deposited on the glass substrate with the substrate temperature of 400 °C using Spray pyrolysis technique. The phase confirmation of the grown thin films was confirmed by X-ray diffraction analysis. From the XRD analysis, the sample shows the amorphous structure. Their surface morphology was probed using Scanning Electron Microscopy and the quality of the grown films was identified by atomic force microscopy analyses. The functional group and optical studies of the prepared films were characterised by Fourier Transform Infra-Red spectroscopy and UV–Vis-double beam spectrometer. The optical energy gap was determined by transmittance measurement.

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Authors and Affiliations

  1. Department of Physics, A.P.A College of Arts & Culture, Palani, Tamilnadu, India

    V. Tamilnayagam & K. Pakiyaraj

  2. Department of Physics, PSNA College of Engineering and Technology, Dindigul, India

    P. Jegatheesan

  3. P.G. and Research Department of Physics, V.H.N.S.N College (Autonomous), Virudhunagar, India

    V. Tamilnayagam, K. Pakiyaraj & L. Amalraj

Authors
  1. V. Tamilnayagam
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  2. P. Jegatheesan
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  4. L. Amalraj
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Correspondence to V. Tamilnayagam.

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Tamilnayagam, V., Jegatheesan, P., Pakiyaraj, K. et al. Structural and optical behaviour of cerium doped TiO2 thin films prepared by spray pyrolysis method. J Mater Sci: Mater Electron 27, 11530–11535 (2016). https://doi.org/10.1007/s10854-016-5282-y

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