Abstract
In this work, [NiFe/NiFeO]10 multilayer thin films were fabricated by magnetron sputtering. The microwave and electromagnetic properties were investigated for different thicknesses, t, of the NiFeO layer (t = 0–6 nm) while the thickness of the NiFe was maintained at 8 nm in every cycle. A clear in-plane uniaxial anisotropy field was induced by an external magnetic field. The in-plane uniaxial anisotropy can be adjusted by tailoring the thickness of the NiFeO layer. When t = 0 nm, the NiFe monolayer, which has a thickness of 80 nm, showed low resistivity (ρ) and ferromagnetic resonance frequency (f r ). By increasing the t from 0 to 6 nm, the ρ of the [NiFe/NiFeO]10 films exhibited a significant monotonic increase (from 111.2 to 268.8 μΩ cm), the f r rose from 1.07 to 2.85 GHz, and the saturation magnetization (4πM s ) was decreased from 12.7 to 10.8 kG. The real part (μ′) of the complex permeability is larger than 100 in the range 0.2–1.9 GHz and the damping coefficient (α eff ) increases to 0.078 for t = 6 nm.
Similar content being viewed by others
References
A.L. Xia, S.K. Liu, C.G. Jin, S.B. Su, J. Mater. Sci. Mater. Electron. 23, 4166 (2013)
G. Perrin, O. Acher, J.C. Peuzin, N. Vukadinovic, J. Magn. Magn. Mater. 157, 289 (1996)
C. Kittel, J. Phys. Rev. 73, 155 (1948)
Y. Liu, C.Y. Tan, Z.W. Liu, C.K. Ong, J. Appl. Phys. 101, 023912 (2007)
S. Ohnuma, T. Iwasa, H. Fujimori, T. Masumoto, J. IEEE Trans. Magn. 42, 2769 (2006)
S.R. Jigajeni, M.M. Sutar, S.M. Salunkhe, P.B. Joshi, J. Mater. Sci. Mater. Electron. 23, 1678 (2012)
S. Sharma, V. Singh, R.K. Kotnala, R.K. Dwivedi, J. Mater. Sci. Mater. Electron. 25, 1915 (2014)
B. Koo, B. Yoo, J. Surf. Coat. Technol. 205, 740 (2010)
E.I. Cooper, C. Bonhote, J. Heidmann, Y. Hsu, P. Kern, J.W. Lam, M. Ramasubramanian, N. Robertson, L.T. Romankiw, J. IBM Res. Dev. 49, 103 (2005)
T. Osaka, T. Asahi, J. Kawaji, T. Yokoshima, J. Electrochim. Acta 50, 4576 (2005)
T. Dastagir, W. Xu, S. Sinha, H. Wu, Y. Cao, H. Yu, J. Appl. Phys. Lett. 97, 162506 (2010)
T. O’Donnell, N. Wang, S. Kulkarni, R. Meere, F.M.F. Rhen, S. Roy, S.C. O’Mathuna, J. Magn. Magn. Mater. 322, 1690 (2010)
C. Jiang, D. Xue, W. Sui, J. Thin Solid Films 519, 2527 (2011)
X. Yang, J.Q. Wei, X.H. Li, L.Q. Gong, T. Wang, F.S. Li, J. Phys. B 407, 555 (2012)
L.X. Phua, N.N. Phuoc, C.K. Ong, J. Alloys Comp. 520, 132 (2012)
L.X. Phua, N.N. Phuoc, C.K. Ong, J. Alloys Comp. 543, 1 (2012)
Y.P. Wu, B.Y. Zong, B.N. Wei, Z.W. Li, J. IEEE Trans. Magn. 50, 1 (2014)
H. Geng, J.Q. Wei, Z.W. Wang, J. Alloys Comp. 576, 13 (2013)
A. Neudert, J. McCord, R. Schafer, L. Schultz, J. Appl. Phys. 95, 6595 (2004)
H. Geng, Y. Wang, J.B. Wang, Z.Q. Li, S.J. Nie, L.S. Wang, Y. Chen, D.L. Peng, H.L. Bai, J. Mater Lett. 67, 99 (2012)
P.C. Fannin, C.N. Marin, I. Malaescu, J. Phy, Condens. Matter. 15, 4739 (2003)
T.L. Gilbert, J. IEEE Trans. Magn. 40, 3443 (2004)
L. Landao, E. Lifshits, J. Phy, Z. Sowjetunion. 8, 153 (1935)
N.N. Phuoc, C.K. Ong, J. Phys. B 406, 3514 (2011)
R.L. Rodrıguez-Suazez, L.H. Vilela-Leao, T. Bueno, A.B. Oliveira, J.R.L. de Almeida, P. Landeros, S.M. Rezende, A. Azevedo, J. Phys. Rev. B 83, 224418 (2011)
H.Y. Chen, N.N. Phuoc, C.K. Ong, J. Appl. Phys. 112, 053920 (2012)
S. Ge, S. Yao, M. Yamaguchi, X. Yang, H. Zuo, T. Ishii, D. Zhou, F. Li, J. Phys. D Appl. Phys. 40, 3660 (2007)
N.N. Phuoc, H.Y. Chen, C.K. Ong, J. Appl. Phys. 113, 063913 (2013)
N.N. Phuoc, L.T. Hung, C.K. Ong, J. Alloys Compd. 506, 504 (2010)
B.C. Craus, G. Palasantzas, A.R. Chezan, O.D. Boerma, L. Niesen, J. Appl. Phys. 97, 013904 (2005)
Acknowledgments
We thank the Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education for providing the Vector Network Analyzer measurement. This work was supported by the Program for New Century Excellent Talents in University (No. MCET-11-1061).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Xu, J., Dai, B., Ren, Y. et al. Electromagnetic and microwave properties of NiFe/NiFeO multilayer thin films. J Mater Sci: Mater Electron 26, 2931–2936 (2015). https://doi.org/10.1007/s10854-015-2779-8
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10854-015-2779-8