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Dielectric relaxation phenomena in the compound: LiCo3/5Mn1/5Cu1/5VO4

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Abstract

Solution-based chemical method has been used to produce LiCo3/5Mn1/5Cu1/5VO4 ceramics. The formation of the compound is checked by X-ray diffraction analysis and it reveals an orthorhombic unit cell structure with lattice parameters of a = 9.8262 Å, b = 3.0706 Å, c = 14.0789 Å. Field emission scanning electron micrograph indicates a polycrystalline texture of the material with grains of unequal sizes (~0.2 to 3 μm). Complex impedance spectroscopy technique is used to study the dielectric properties. Temperature dependence of dielectric constant (ε r) at various frequencies exhibits the dielectric anomalies in ε r at T c (transition temperature) = 245, 255, 260 and 265 °C with (εr)max. ~458, 311, 214 and 139 for 50, 100, 200 and 500 kHz, respectively. Frequency dependence of tangent loss at various temperatures shows the presence of dielectric relaxation in the material.

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Acknowledgments

The author is grateful to the Nanomaterials Laboratory of the Department of Chemistry and Central Research Facility, Indian Institute of Technology, Kharagpur-721302 (W.B.), India, for providing facilities to conduct experiments.

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  1. Department of Physics and Meteorology, Indian Institute of Technology, Kharagpur, West Bengal, 721302, India

    Moti Ram

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  1. Moti Ram
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Ram, M. Dielectric relaxation phenomena in the compound: LiCo3/5Mn1/5Cu1/5VO4 . J Mater Sci: Mater Electron 22, 426–429 (2011). https://doi.org/10.1007/s10854-010-0154-3

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  • DOI: https://doi.org/10.1007/s10854-010-0154-3

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