Abstract
MgxZn1−xO thin films were deposited on Corning eagle 2,000 glass substrates by a RF magnetron sputtering using a ceramic target. The effect of Ar/O2 ratios on structural and optical properties was investigated. The XRD results showed that the film demonstrated the best structural properties when the Ar/O2 ratio equal 7:3. Sputtering ambient seemed to have minor effect on the optical properties of MgxZn1−xO thin films.
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Acknowledgments
This work was supported by the “Hundred Talents Program,” the Chinese Academy of Sciences, the Zhejiang Natural Science Foundation (Y407364), and the Ningbo Natural Science Foundation (No. 2007A610027, No. 2008A610047, No. 2009A610018). The authors would give thanks to the all measurers of XRD, SEM, XPS and UV–Vis absorption spectroscopy of Ningbo Institute of Material Technology & Engineering Chinese Academy of Science.
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Li, J., Huang, JH., Song, WJ. et al. Effect of deposition ambient on structural and optical properties of MgxZn1−xO alloy thin films grown by RF sputtering. J Mater Sci: Mater Electron 21, 1327–1331 (2010). https://doi.org/10.1007/s10854-010-0070-6
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DOI: https://doi.org/10.1007/s10854-010-0070-6