Skip to main content
Log in

Effect of doping on properties of Zno:Cu and Zno:Ag thin films

  • Published:
Journal of Materials Science: Materials in Electronics Aims and scope Submit manuscript

Abstract

ZnO:Cu and ZnS thin films were grown by metal-organic chemical vapour deposition (MOCVD) under atmospheric pressure onto glass substrates. The ZnO:Ag films were fabricated from ZnS films by non-vacuum method that consists of simultaneous oxidation and Ag-doping by the close spaced evaporation (CSE) of silver at the temperature of 500–600 °C. Photo-assisted rapid thermal annealing (PARTA) at ambient air during 10–30 s at the temperature of 700–800 °C was used for the ZnO:Cu films. The samples were studied by X-ray diffraction technique (XRD), atomic force microscopy (AFM), and photoluminescence (PL) measurements. The grain size of ZnO:Cu films increased with an increase of Cu concentration. PL spectra of as-deposited ZnO:Cu films depended on Cu concentration and contained the bands typical for the copper. After PARTA at high temperature the emission maximum shifted towards the short-wave region. During the fabrication of ZnO:Ag films the grain growth process was strongly affected by the Ag loading level. The grain size increased with an increase of Ag concentration and ZnO:Ag films with surface roughness of 8 nm were obtained. Observed 385 nm PL peak for these samples can be attributed to the exciton–exciton emission that proves the high quality of the obtained ZnO:Ag films.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4

Similar content being viewed by others

References

  1. D. Reynolds, D. Look, B. Jogai, Solid State Commun. 99, 873 (1996)

    Article  CAS  Google Scholar 

  2. D. Bagnall, Y. Chen, M. Shen, Z. Zhu, T. Goto, T. Yao, Appl. Phys. Lett. 70, 2230 (1997)

    Article  CAS  Google Scholar 

  3. T. Aoki, Y. Hatanaka, D. Look, Appl. Phys. Lett. 76, 3257 (2000)

    Article  CAS  Google Scholar 

  4. K. Minegishi, Y. Koiwai, Y. Kikuchi, K. Yano, M. Kasuga, A. Shimizu, Jpn. J. Appl. Phys. 36, L1453 (1997)

    Article  CAS  Google Scholar 

  5. A.H. Jayatissa, Semicond. Sci. Technol. 18, L27 (2003)

    Article  CAS  Google Scholar 

  6. C. Bettencourt, E. Llobet, P. Ivanov, X. Vilanova, X. Correig, M.A.P. Silva, L.A.O. Nunes, J.J. Pireaux, J. Phys. D: Appl. Phys. 37, 3383 (2004)

    Article  Google Scholar 

  7. Yu.V. Kopytko, Yu.A. Tzyrkunov, V.G. Verbizkii, A.V. Solonko, in Proceedings of the 5th SID Symposium on Advanced Display Technologies, Minsk, Belarus, September 1996, ed. by A.G. Smirnov (SPS “MicroVideoSystems”, Minsk, 1996) p. 86

  8. L.F. Zhanorsky, L.V. Zavyalova, G.S. Svechnikov, Thin Solid Films 128, 241 (1985)

    Article  Google Scholar 

  9. B.E. Warren, X-Rays Diffraction (Dover publications, INC, New York, 1990), p. 251

    Google Scholar 

  10. J.P. Enríquez, X. Mathew, J. Cryst. Growth 259, 215 (2003)

    Article  Google Scholar 

  11. H.-Y. Lu, S.-Y. Chu, S.-S. Tan, J. Cryst. Growth 269, 385 (2004)

    Article  CAS  Google Scholar 

  12. R. Dingle, Phys. Rev. Lett. 23, 579 (1969)

    Article  CAS  Google Scholar 

  13. Z. Fang, Y. Wang, D. Xu, Y. Tan, X. Liu, Opt. Mater. 26, 239 (2004)

    Article  CAS  Google Scholar 

  14. Y. Feng, Y. Zhou, Y. Liu, G. Zhang, X. Zhang, J. Luminescence 119120, 239 (2004)

    Google Scholar 

  15. V.A. Nikitenko, M.M. Malov, P.G. Pasko, V.D. Chernuj, J. Appl. Spectrosc. 21, 835 (1974)

    CAS  Google Scholar 

  16. H.-M. Cheng, H.-C. Hsu, S.-L. Chen, W.-T. Wu, C.-C. Kao, L.-J. Lin, W.-F. Hsieh, J. Cryst. Growth 277(1–4), 192 (2005)

    Article  CAS  Google Scholar 

  17. T. Hirai, Y. Harada, S. Hashimoto, T. Itoh, N. Ohno, J. Luminescence 112, 196 (2005)

    Article  CAS  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to T. Kryshtab.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Kryshtab, T., Khomchenko, V.S., Khachatryan, V.B. et al. Effect of doping on properties of Zno:Cu and Zno:Ag thin films. J Mater Sci: Mater Electron 18, 1115–1118 (2007). https://doi.org/10.1007/s10854-007-9256-y

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10854-007-9256-y

Keywords

Navigation