Abstract
Polycrystalline bismuth ferrite (BiFeO3 or BFO) thin films were prepared by chemical solution deposition to explore the impact of processing conditions including annealing temperature, percent excess bismuth, and gel drying temperature on film microstructure and properties. Incorporating 0–5 % excess Bi and annealing at 550 °C in air produced stoichiometric single-phase BiFeO3 films. Deviation from this temperature yielded the bismuth-rich Bi36Fe2O57 phase at temperatures below 550 °C or the bismuth-deficient Bi2Fe4O9 phase at temperatures above 550 °C, both of which contributed to higher DC leakage. However, even single-phase BiFeO3 films produced at 550 °C show high DC leakage (~1.2 × 10−1 A/cm2 at 140 kV/cm) due to a porous microstructure. We have thus investigated unconventional thermal treatments that significantly increase film densification while maintaining phase purity. Under these revised thermal treatment conditions, room temperature leakage current values are reduced by three orders of magnitude to ~1.0 × 10−4 A/cm2 at 140 kV/cm.
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Hill NA (2000) J Phys Chem B 104:6694
Martin LW, Chu Y-H, Ramesh R (2010) Mater Sci Eng R 68:89
Neaton JB, Ederer C, Waghmare UV, Spaldin NA, Rabe KM (2005) Phys Rev B 71:014113
Yun KY, Ricinschi D, Kanashima T, Noda M, Okuyama M (2004) Jpn J Appl Phys 43:L647
Michel C, Moreau J-M, Achenbach GD, Gerson R, James WJ (1969) Solid State Commun 7:701
Sosnowska I, Peterlin-Neumaier T, Steichele E (1982) J Phys C Solid State Phys 15:4835
Kubel F, Schmid H (1990) Acta Cryst B46:698
Kiselev S, Ozerov R, Zhdanov G (1963) Sov Phys- Dokl 7:742
Eerenstein W, Morrison FD, Sher F, Prieto JL, Attfield JP, Scott JF, Mathur ND (2007) Philos Mag Lett 87:249
Yun KY, Noda M, Okuyama M (2004) J Appl Phys 96:3399
Scott JF (2008) J Phys Condens Matter 20:021001
Naganuma H, Okamura S (2007) J Appl Phys 101:09M103
Kawae T, Tsuda H, Morimoto A (2008) Appl Phys Express 1:3
Singh SK, Kim YK, Funakubo H, Ishiwara H (2006) Appl Phys Lett 88:14
Singh SK, Ishiwara H (2006) Jpn J Appl Phys 45(4B):3194
Singh SK, Ishiwara H (2006) J Electroceram 16:553
Béa H, Bibes M, Barthélémy A, Bouzehouane K, Jacquet E, Khodan A, Contour J-P, Fusil S, Wyczisk F, Forget A, Lebeugle D, Colson D, Viret M (2005) Appl Phys Lett 87:072508
Wang YP, Zhou L, Zhang MF, Chen XY, Liu J-M, Liu ZG (2004) Appl Phys Lett 84:1731
Ueda K, Tabata H, Kawai T (1999) Appl Phys Lett 75:555
Cheng J-R, Cross LE (2003) J Appl Phys 94:5188
Uchida H, Ueno R, Funakubo H, Koda S (2004) J Appl Phys 100:014106
Kothari D, Reddy VR, Gupta A, Phase DM, Lakshmi N, Deshpande SK, Awasthi AM (2007) J Phys Condens Matter 19:1
Wang J, Neaton JB, Zheng H, Nagarajan V, Ogale SB, Liu B, Viehland D, Vaithyanathan V, Schlom DG, Waghmare UV, Spaldin NA, Rabe KM, Wuttig M, Ramesh R (2003) Science 299:1719
Yang SY, Zavaliche F, Mohaddes-Ardabili L, Vaithyanathan V, Schlom DG, Lee YJ, Chu YH, Cruz MP, Zhan Q, Zhao T, Ramesh R (2005) Appl Phys Lett 87:102903
Ueno R, Okaura S, Funakubo H, Saito K (2005) Jpn J Appl Phys 44:L1231
Tian W, Vaithyanathan V, Schlom DG, Zhan Q, Yang SY, Chu YH, Ramesh R (2007) Appl Phys Lett 90:172908
Das RR, Kim DM, Baek SH, Eom CB, Zavaliche F, Yang SY, Ramesh R, Chen YB, Pan XQ, Ke X, Rzchowski MS, Streiffer SK (2006) Appl Phys Lett 88:242904
Liu Z, Liu H, Du G, Zhang J, Yao K (2006) J Appl Phys 100:21–24
Hu GD, Fan SH, Yang CH, Wu WB (2008) Appl Phys Lett 92:192905
Tyholdt F, Jørgensen S, Fjellvåg H, Gunnæs AE (2005) J Mater Res 20:2127
Schwartz RW (1997) Chem Mater 9:2325
Keddie JL, Giannelis EP (1991) J Am Ceram Soc 74:2669
Acknowledgements
Funding for this work was provided by the Department of Education (DOE) Graduate Assistantship in Areas of National Need (GAANN) Fellowship, the North Carolina State University Graduate School, and the National Science Foundation DMR grant 0547134. The authors are grateful for help with SEM by the Analytical Instrumentation Facility (AIF) at NCSU.
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Casper, M.D., Losego, M.D. & Maria, JP. Optimizing phase and microstructure of chemical solution-deposited bismuth ferrite (BiFeO3) thin films to reduce DC leakage. J Mater Sci 48, 1578–1584 (2013). https://doi.org/10.1007/s10853-012-6914-0
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DOI: https://doi.org/10.1007/s10853-012-6914-0