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Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing

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Abstract

This paper proposes a power integrity control technique for dynamically controlling power supply voltage fluctuations for a device under test (DUT), and demonstrates its effectiveness for eliminating the overkills/underkills due to the difference of power supply impedance between an automatic test equipment (ATE) and a practical operating environment of the DUT. The proposed method injects compensation currents into the power supply nodes on the ATE system in a feed-forward manner such that the ATE power supply waveform matches with the one on the customer’s operating environment of the DUT. A method for calculating the compensation current is also described. Experimental results show that the proposed method can emulate the power supply voltage waveform under a customer’s operating condition and eliminate 95 % of overkills/underkills in the maximum operating frequency testing with 105 real silicon devices. Limitations and applications of the proposed method are also discussed.

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Authors and Affiliations

  1. Advantest Corporation, 336-1 Ohwa, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan

    Masahiro Ishida & Takashi Kusaka

  2. VLSI Design and Education Center, The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-0032, Japan

    Toru Nakura & Kunihiro Asada

  3. The School of Engineering, Tokyo Denki University, 5 Senjuasahi-cho, Adachi-ku, Tokyo, 120-8551, Japan

    Satoshi Komatsu

Authors
  1. Masahiro Ishida
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  2. Toru Nakura
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  3. Takashi Kusaka
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  4. Satoshi Komatsu
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  5. Kunihiro Asada
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Correspondence to Masahiro Ishida.

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Responsible Editor: R. A. Parekhji

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Ishida, M., Nakura, T., Kusaka, T. et al. Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing. J Electron Test 32, 257–271 (2016). https://doi.org/10.1007/s10836-016-5582-4

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  • DOI: https://doi.org/10.1007/s10836-016-5582-4

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