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Erratum to: J Electron Test (2015) 31(5–6):525–536
DOI 10.1007/s10836-015-5544-2
The original version of this article unfortunately contained a mistake. Figure 9 was incorrect. The corrected figure is given below.
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The online version of the original article can be found at http://dx.doi.org/10.1007/s10836-015-5544-2.
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Gören, S., Gürsoy, C.C. & Yildiz, A. Erratum to: Speeding Up Logic Locking via Fault Emulation and Dynamic Multiple Fault Injection. J Electron Test 32, 105–106 (2016). https://doi.org/10.1007/s10836-015-5558-9
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DOI: https://doi.org/10.1007/s10836-015-5558-9