Abstract
In this paper, we present a new recursive method to compute higher order sensitivities of node voltages, as well as those of circuit performances (gain, input and output impedances, or reflection coefficients) with respect to all circuit parameters. Using the sensitivity coefficients we formulate multivariate polynomial equations. Fault identification is obtained by solving these equations with respect to element deviations. This task can be accomplished by using a multivariable Newton–Raphson procedure (mNR) for solving nonlinear multivariable equations.
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Cherubal S, Chatterjee A (2001) Test generation based diagnosis of device parameters for analog circuits. In: Proc. Design, Automation and Test in Europe Conf., pp 596–602
Farchy SL, Gadzheva ED, Raykovska LH, Kouyoumdjiev TG (1995) Nullator-norator approach to analogue circuit diagnosis using general-purpose analysis programmes. Int J Circ Theory Appl 23(6):571–585
Garczarczyk ZA (2007) Polynomial fault diagnosis of linear analog circuits, In: Proc. 18th European Conference on Circuit Theory and Design, pp 842–845
Guo Z, Savir J (2003) Analog circuit test using transfer function coefficient estimates. In: Proc. International Test Conf., pp 1155–1163
Ibidapo-Obe O, Asaolu OS, Badiru AB (2002) A new method for the numerical solution of simultaneous nonlinear equations. Appl Math Comput 125(1):133–140
Litovski VB, Litovski IV, Zwolinski M (2004) Concurrent analogue fault simulation, the equation formulation aspect. Int J Circ Theory Appl 32(6):487–507
Rutkowski J, Golonek T (2001) Application of genetic algorithms to analog fault diagnosis. In: Proc. 15th European Conference on Circuit Theory and Design, pp 253–256
Sindia S, Agrawal VD, Singh V (2012) Parametric fault testing of non-linear analog circuits based on polynomial and V-transform coefficients. J Electron Test: Theory Appl 28(5):757–771
Sindia, S, Singh, V, Agrawal, V.D (2009) Polynomial coefficient based DC testing of non-linear analog circuits. In: Proc. Great Lakes Symposium on VLSI, pp 69–74
Worsman M, Wong MWT (2000) Non-linear analog circuit fault diagnosis with large change sensitivity. Int J Circ Theory Appl 28(3):281–303
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Responsible Editor: V. D. Agrawal
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Yu, W., He, Y. Analog Circuit Fault Diagnosis via Sensitivity Computation. J Electron Test 31, 119–122 (2015). https://doi.org/10.1007/s10836-015-5509-5
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DOI: https://doi.org/10.1007/s10836-015-5509-5