Abstract
This paper describes a built-in self test technique for RF subsystems, using low-overhead on-chip detectors to calculate circuit specifications. A novel on-chip amplitude detector has been designed and optimized for RF circuit specification test. The detector has small area overhead with a low-frequency output. A test chip was fabricated in a commercial 0.18 μm CMOS process. By using on-chip detectors in a loopback setup, both the system performance and specifications of the individual components can be accurately measured. Measurements show accurate prediction of system and component specifications.
Similar content being viewed by others
References
Agilent Technologies (2006) Agilent ESA-E Series and PSA Series Spectrum Analyzer Noise Figure Measurement Personality Guide Option 219
Bhattacharya S, Chatterjee A (2004) A built-in loopback test methodology for RF transceiver circuits using embedded sensor circuits. In: Proc. 13th Asian test symposium, pp 68–73
Bhattacharya S, Halder A, Srinivasan G, Chatterjee A (2005) Alternate testing of RF transceivers using optimized test stimulus for accurate prediction of systems specifications. J Electron Test: Theory and Applications 21(3):323–339
Bhattacharya S, Senguttuvan R, Chatterjee A (2005) Production test method for evaluating the effect of narrow-band interference on data errors in ultra-wide band (UWB) receivers. In: IEEE MTT-S international microwave symposium digest, p 4
Cherubal S, Voorakaranam R, Chatterjee A, Mclaughlin J, Smith JL, Majernik DM (2004) Concurrent RF test using optimized modulated RF stimuli. In: Proc. 17th international VLSI design conference, pp 1017–1022
Eliezer O, Bashir I, Staszewski R, Balsara P (2007) Built-in self testing of DPR-based GSM transmitter. In: Proc. IEEE radio frequency integrated circuits symposium, pp 339–342
Friedman JH (1991) Multivariate adaptive regression splines. Ann Stat 19(1):1–141
Fong KL, Hull CD, Meyer RG (1997) A class AB monolithic mixer for 900-MHz applications. IEEE J Solid-State Circuits 32(8):1166–1172
Agilent Technologies (2010) Fundamentals of RF and Microwave Noise Figure Measurement. Agilent Application Note AN 57-1
Haider A, Bhattacharya S, Srinivasan G, Chatterjee A (2005) A system-level alternate test approach for specification test of RF transceivers in loopback mode. In: Proc. 18th international conference on VLSI design, pp 289–294
Halder A, Chatterjee A (2006) Low-cost production testing of wireless transmitter designs. In: Proc. 19th international conference on VLSI design, p. 6
Han D, Chatterjee A (2005) Robust built-in test of RF ICs using envelope detectors. In: Proc. 14th Asian test symposium, pp 2–7
Huang Y, Hsieh H, Lu L (2007) A low-noise amplifier with integrated current and power sensors for RF BIST applications. In: Proc. 25th IEEE VLSI test symmposium, p 6
ITRS (2007) International Technology Roadmap for Semiconductors 2007 Edition
Jonsson F, Olsson H (2004) RF detector for on-chip amplitude measurements. In: Electronic letters, vol 40(20)
Kim C, Lee S (2003) 5-GHz CMOS up-conversion mixer. In: Proc. Asia-Pacific microwave conference, p 4
Lee TH (2003) The design of CMOS radio-frequency integrated circuits, 2nd edn. Cambridge University Press
Valdes-Garcia A, Venkatasubramanian R, Srinivasan R, Silva-Martinez J, Sanchez-Sinencio E (2005) A CMOS RF RMS detector for built-in testing of wireless transceivers. In: Proc. 23rd IEEE VLSI test symposium, pp 249–254
Valdes-Garcia A et al (2007) Built-in self test of RF transceiver SoCs: from signal chain to RF synthesizers. In: Proc. IEEE radio frequency integrated circuits symposium, pp 335–338
Voorakaranam R, Cherubal S, Chatterjee A (2002) A signature test framework for rapid production testing of RF circuits. In: Proc. design, automation and test in Europe conference and exhibition, pp 186–191
Wang Q, Soma M (2006) RF front-end system gain and linearity built-in test. In: Proc. the 24th IEEE VLSI test symposium, pp 6
Zhang T, Eisenstadt WR, Fox RM (2004) A novel 5 GHz RF power detector. In: Proc. international symposium on circuits and systems, vol 1, pp 897–900.
Zhang C, Gharpurey R, Abraham J (2007) Built-in test of RF mixers using RF amplitude detectors. In: Proc. international symposium on quality electronic design, p 6
Zhang C, Gharpurey R, Abraham J (2008) Low cost RF receiver parameter measurement with on-chip amplitude detectors. In: Proc. VLSI test symposium, p 6
Zhang C, Gharpurey R, Abraham J (2009) On-lone calibration and power optimization of RF systems using a built-in detector. In: Proc. VLSI test symposium, p 6
Acknowledgments
This work was supported in part by the National Science Foundation under Grant CCR-0325371.
Author information
Authors and Affiliations
Corresponding author
Additional information
Responsible Editor: D. Keezer
Rights and permissions
About this article
Cite this article
Zhang, C., Gharpurey, R. & Abraham, J.A. Built-in Self Test of RF Subsystems with Integrated Detectors. J Electron Test 28, 557–569 (2012). https://doi.org/10.1007/s10836-012-5315-2
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10836-012-5315-2