Abstract
This paper presents a comparative analysis of ADOFs (Address Decoder Open Faults) and resistive-ADOFs in embedded-SRAMs. Such faults are the primary target of this study because they are hard-to-detect faults. These faults are caused by some particular defects which may appear in the parallel transistor network of the logic gates in the address decoders. With this study, we show that the test conditions required for ADOFs testing (sensitization and observation) are also useful for resistive-ADOFs detection, but more stringent timing requirements are needed. In the last part of the paper, we propose a study on the conditions to detect ADOFs with March tests. Moreover, we propose new March elements, which are effective for ADOF testing, and which can be added to existing March tests.
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Editor: B. F. Cockburn
*This work has been partially funded by the French government under the framework of the MEDEA+ A503 “ASSOCIATE” European program.
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Dilillo, L., Girard, P., Pravossoudovitch, S. et al. ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J Electron Test 22, 287–296 (2006). https://doi.org/10.1007/s10836-006-7761-1
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DOI: https://doi.org/10.1007/s10836-006-7761-1