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Substrate effect on the electrical properties of sputtered YSZ thin films for co-planar SOFC applications

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Abstract

The physical and electrical properties of sputtered YSZ thin films on various substrates were investigated. The in-plane electrical properties of the films were measured for evaluating YSZ thin film for co-planar SOFC electrolytes. The conductance measured on YSZ over Si substrates was significantly affected by the buffer layer thickness and exhibited higher values than that of YSZ on sapphire. This indicates that electrical leakage occurred through the substrate when Si substrates were utilized. Nevertheless, pure ionic conduction was observed in YSZ/sapphire regardless of the film thickness. It implies that much care should be taken for the selection of substrate materials in measuring or utilizing in-plane conductivity, especially for high temperature applications.

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Acknowledgment

This work has been supported by the Institutional Research Program and NRL Program of Korea Institute of Science and Technology (KIST).

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  1. Center for Energy Materials Research, Korea Institute of Science and Technology, P.O. Box 131, Cheongryang, Seoul, 130-650, Korea

    Sung Moon Kim, Ji-Won Son, Kyung-Ryul Lee, Hyoungchul Kim, Hae-Ryoung Kim, Hae-Weon Lee & Jong-Ho Lee

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  1. Sung Moon Kim
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Correspondence to Ji-Won Son.

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Kim, S.M., Son, JW., Lee, KR. et al. Substrate effect on the electrical properties of sputtered YSZ thin films for co-planar SOFC applications. J Electroceram 24, 153–160 (2010). https://doi.org/10.1007/s10832-008-9550-y

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