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Taking into Account Interelement Interference in X-Ray Fluorescence Analysis of Thin Two-Layer Ti/V Systems

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Journal of Applied Spectroscopy Aims and scope

We propose a new method for determining the thickness of layers in x-ray fluorescence analysis of two-layer Ti/V systems, using easily fabricated standardized film layers obtained by sputter deposition of titanium on a polymer film substrate. We have calculated correction factors taking into account the level of attenuation for the intensity of the primary emission from the x-ray tube and the analytical line for the element of the bottom layer in the top layer, and the enhancement of the fluorescence intensity for the top layer by the emission of atoms in the bottom layer.

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References

  1. Yu. A. Ignatova, A. N. Eritenko, A. G. Revenko, and A. L. Tsvetyanskii, Analitika Kontrol’, 15, No. 2, 126–140 (2011).

    Google Scholar 

  2. V. R. Darashkevich, B. A. Malyukov, and G. M. Turovskaya, Zh. Anal. Khim., 34, No. 1, 138–141 (1979).

    Google Scholar 

  3. B. Kanrar, K. Sanyal, N. L. Misra, and S. K. Aggarwal, Spectrochim. Acta B: At. Spectrosc., 101, 130–133 (2015).

    Article  ADS  Google Scholar 

  4. P. Jonnard, H. Maury, and J.-M. Andre, X-Ray Spectrom., 36, 72–75 (2007).

    Article  ADS  Google Scholar 

  5. K. Nygård, K. Hämäläinen, S. Mannien, P. Jalas, and J.-P. Ruottinen, X-Ray Spectrom., 33, 354–359 (2004).

    Article  ADS  Google Scholar 

  6. V. Ya. Borkhodoev, Zh. Analit. Khim., 53, No. 6, 571–577 (1998).

    Google Scholar 

  7. N. I. Mashin, N. K. Rudnevskii, Yu. S. Kalinin, and A. I. Mashin, Zav. Lab., 56, No. 12, 34–36 (1990).

    Google Scholar 

  8. E. E. Belyaeva, A. V. Ershov, A. I. Mashin, N. I. Mashin, and N. K. Rudnevskii, Zh. Anal. Khim., 53, No. 6, 638–640 (1998) [E. E. Belyaeva, A. V. Ershov, A. I. Mashin, N. I. Mashin, and N. K. Rudnevskii, J. Analyt. Chem., 53, 561–563 (1998) (English translation)].

  9. N. I. Mashin, A. N. Tumanova, and N. K. Rudnevskii, Zh. Anal. Khim., 56, No. 6, 651–654 (2001) [N. I. Mashin, A. N. Tumanova, and N. K. Rudnevskii, J. Analyt. Chem., 56, 581–584 (2001) (English translation)].

  10. N. I. Mashin, R. B. Lebedeva, A. N. Tumanova, and A. A. Ershov, Zh. Prikl. Spektrosk., 79, No. 2, 328–332 (2012) [N. I. Mashin, R. B. Lebedeva, A. N. Tumanova, and A. A. Ershov, J. Appl. Spectrosc., 79, No. 2, 307–311 (2012) (English translation)].

  11. N. I. Mashin, E. A. Cherniaeva, A. N. Tumanova, and A. A. Ershov, Neorg. Mater. 49, No. 4, 372–375 (2013).

    Article  Google Scholar 

  12. K. Hirokawa, M. Suzuki, and H. Goto, Z. Anal. Chem., 199, No. 2, 89–94 (1964).

    Article  Google Scholar 

  13. H. Dahl and G. Schulz, Z. Angew. Phys., 29, No. 2, 117–121 (1970).

    Google Scholar 

  14. S. L. Dudik, B. D. Kalinin, R. I. Plotnikov, and S. K. Savel’ev, Analitika Kontrol’, 10, No. 3–4, 282–289 (2006).

  15. V. Ya. Borkhodoev, Analitika Kontrol’, 19, No. 1, 40–44 (2015).

    Google Scholar 

  16. Sh. I. Duimakaev and M. V. Pot’kalo, Analitika Kontrol’, 20, No. 1, 23–33 (2016).

    Google Scholar 

  17. G. A. Bordovskii, A. V. Marchenko, P. P. Skregin, N. N. Smirnova, and E. I. Terukov, Pis′ma Zh. Tekh. Fiz., 35, No. 22, 15–22 (2009).

    Google Scholar 

  18. M. West, A. T. Ellis, P. J. Potts, C. Streli, C. Vanhoof, and P. Wobrauschek, J. Anal. At. Spectrom., 30, 1874–1877 (2015).

    Article  Google Scholar 

  19. V. R. Darashkevich, N. A. Kalinina, B. A. Malyukov, Yu. M. Ukrainskii, and S. P. Selivanova, Zav. Lab., 37, No. 12, 1449–1452 (1971).

    Google Scholar 

  20. F. E. Naumtsev, V. F. Volkov, and N. F. Losev, Zav. Lab., 54, No. 4, 30–33 (1988).

    Google Scholar 

  21. N. I. Mashin, A. G. Razuvaev, E. A. Chernyaeva, A. N. Tumanova, and A. A. Ershov, Zh. Prikl. Spektrosk., 80, No. 1, 5–11 (2013) [N. I. Mashin, A. G. Razuvaev, E. A. Chernyaeva, A. N. Tumanova, and A. A. Ershov, J. Appl. Spectrosc., 80, No. 1, 1–7 (2013) (English translation)].

  22. N. I. Mashin, E. A. Chernyaeva, A. N. Tumanova, and L. M. Gafarova, Zh. Prikl. Spektrosc., 83, 65–69 (2016) [N. I. Mashin, E. A. Chernyaeva, A. N. Tumanova, and L. M. Gafarova, J. Appl. Spectrosc., 83, 56–60 (2016) (English translation)].

  23. N. I. Mashin, E. A. Chernyaeva, and A. N. Tumanova, Neorg. Mater., 51, No. 1, 44–48 (2015).

    Article  Google Scholar 

  24. V. P. Afonin, N. I. Komyak, V. P. Nikolaev, and R. I. Plotnikov, X-Ray Fluorescence Analysis [in Russian], Nauka, Novosibirsk (1991), pp. 128–129.

    Google Scholar 

  25. A. S. Berezin and O. R. Mochalkina, Integrated Circuit Technology and Design [in Russian], Radio i Svyaz′, Moscow (1983), pp. 84–86.

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Authors and Affiliations

  1. N. I. Lobachevskii Nizhny Novgorod National Research State University, 23, Bldg. 5, Gagarin Ave., Nizhnii Novgorod, 603950, Russia

    N. I. Mashin, A. G. Razuvaev, E. A. Cherniaeva, L. M. Gafarova & A.V. Ershov

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  1. N. I. Mashin
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  2. A. G. Razuvaev
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  3. E. A. Cherniaeva
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  4. L. M. Gafarova
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  5. A.V. Ershov
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Correspondence to N. I. Mashin.

Additional information

Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 85, No. 1, pp. 100–107, January–February, 2018.

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Mashin, N.I., Razuvaev, A.G., Cherniaeva, E.A. et al. Taking into Account Interelement Interference in X-Ray Fluorescence Analysis of Thin Two-Layer Ti/V Systems. J Appl Spectrosc 85, 90–97 (2018). https://doi.org/10.1007/s10812-018-0617-5

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  • DOI: https://doi.org/10.1007/s10812-018-0617-5

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