The feasibility of an approach based on reference samples of elements with similar atomic numbers is considered for x-ray fluorescence determination of the surface density of manganese thin films. This diagnostic technique is found to provide sufficient accuracy in surface density measurements.
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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 82, No. 1, pp. 76–80, January–February, 2015.
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Mashin, N.I., Chernjaeva, E.A., Tumanova, A.N. et al. Determination of Surface Density of Thin Manganese Films Using Reference Samples of Elements with Similar Atomic Numbers. J Appl Spectrosc 82, 72–75 (2015). https://doi.org/10.1007/s10812-015-0066-3
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DOI: https://doi.org/10.1007/s10812-015-0066-3