Abstract
In X-ray fluorescence determinations of the surface density of thin chromium and iron films, we studied the possibility of using an approach based on the application of reference samples of elements with close atomic numbers. It was shown that the proposed diagnostic approach ensures the determination of the surface density of films with rather high precision.
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Original Russian Text © N.I. Mashin, E.A. Chernyaeva, A.N. Tumanova, A.A. Ershov, 2016, published in Zhurnal Analiticheskoi Khimii, 2016, Vol. 71, No. 6, pp. 597–601.
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Mashin, N.I., Chernyaeva, E.A., Tumanova, A.N. et al. X-ray fluorescence determination of the surface density of thin chromium and iron films using reference samples of elements with close atomic numbers. J Anal Chem 71, 569–572 (2016). https://doi.org/10.1134/S1061934816060095
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DOI: https://doi.org/10.1134/S1061934816060095