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X-ray photoelectron analysis of lead-silicate glass structure

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Journal of Applied Spectroscopy Aims and scope

Characteristics of the atomic structure of lead-silicate glasses, among them the concentration of lead structural forms, the statistics of both silicon-oxygen and lead-oxygen structures of medium-range ordering, and the bonding degrees of silicon-oxygen and lead-oxygen structures, have been found using x-ray photoelectron spectroscopy and thermodynamic simulation.

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Authors and Affiliations

  1. Physical-Technical Institute, Ural Branch Russian Academy of Sciences, 132 Kirov St., Izhevsk, 426000, Russia

    O. M. Kanunnikova & O. Yu. Goncharov

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  1. O. M. Kanunnikova
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  2. O. Yu. Goncharov
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Correspondence to O. M. Kanunnikova.

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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 76, No. 2, pp. 209–217, March–April, 2009.

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Kanunnikova, O.M., Goncharov, O.Y. X-ray photoelectron analysis of lead-silicate glass structure. J Appl Spectrosc 76, 194–202 (2009). https://doi.org/10.1007/s10812-009-9164-4

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  • DOI: https://doi.org/10.1007/s10812-009-9164-4

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