Abstract
Accurate knowledge of spectral emissivity is very important in many technological and scientific applications. In this study, a new measuring system, which can realizes spectral directional emissivity measurements under controlled environment conditions, was constructed. The apparatus realizes the high accuracy emissivity measurement through the precision knowledge of the sample surface temperature and the high-precision calibration. The temperature of the sample surface is accurately measured by the suitable method depending on the sample type. Accurately determining the spectral response function and the background radiation are obtained by the modified two-temperature calibration method proposed in this study. The evaluation of the assisted blackbody shows that it has good temperature uniformity and high emissivity, which guarantee the effectiveness of the modified two-temperature calibration method. Spectral emissivity of silicon carbide was measured, and the conformity with literature data around the Christiansen wavelength proves the reliability of the developed apparatus. In addition, the spectral emissivity of copper during the real time oxidation was measured to check the capability of the emissivity measurements under controlled environment. Finally, the uncertainty for silicon carbide at 1073 K is evaluated, and the relative combined standard uncertainty for silicon carbide sample at 1073 K is better than 2.9 %.
Similar content being viewed by others
Data Availability
Availability of data and material is clearly stated in the text.
References
F. Lizama-Tzec, J. Macías, M. Estrella-Gutiérrez, A. Cahue-López, O. Arés, R. De Coss, J. Alvarado-Gil, G. Oskam, J. Mater. Sci.-Mater. Electron. 26, 5553 (2015)
K. Hirano, R. Fabbro, M. Muller, J. Phys. D 44, 435402 (2014)
G.D. Stefanidis, K.M. Van Geem, G.J. Heynderickx, G.B. Marin, Chem. Eng. J. 137, 411 (2008)
G. Shaoa, Y. Lua, D.A.H. Hanaorc, S. Cuia, J. Jiaod, Corros. Sci. 146, 233 (2019)
M. Minissale, C. Pardanaud, R. Bisson, L. Gallais, J. Phys. D 50, 455601 (2017)
S. Zhao, X. Li, X. Zhou, K. Cheng, X. Huai, Appl. Therm. Eng. 109, 663 (2016)
G. Cao, S.J. Weber, S.O. Martin, T.L. Malaney, S.R. Slattery, M.H. Anderson, K. Sridharan, T.R. Allen, Nucl. Technol. 175, 460 (2011)
Y. Xu, K. Zhang, Z. Tian, R. Tong, K. Yu, Y. Liu, Infrared Phys. Technol. 126, 104344 (2022)
L.D. Campo, R.B. Pérezsáez, X. Esquisabel, I. Fernández, M.J. Tello, Rev. Sci. Instrum. 77, 113111 (2006)
K. Nakazawa, A. Ohnishi, Int. J. Thermophys. 31, 2010 (2010)
P. Honnerová, J. Martan, M. Kučera, M. Honner, J. Hameury, Meas. Sci. Technol. 25, 30 (2014)
M. Yoshida, N. Utsumi, R. Ichiki, J.H. Kong, M. Okumiya, Adv. Mater. Res. 1110, 163 (2015)
C. Monte, B. Gutschwager, S.P. Morozova et al., Int. J. Thermophys. 30, 203 (2009)
L. Hanssen, B. Wilthan, C. Monte, J. Hollandt, J. Hameury, J.R. Filtz, F. Girard, M. Battuello, J. Ishii, Metrologia 53, 03001 (2016)
M. Honner, P. Honnerova, Appl. Opt. 54, 669 (2015)
D. Ren, H. Tan, Y. Xuan, Y. Han, Q. Li, Int. J. Thermophys. 37, 51 (2016)
O. Rozenbaum, D.D.S. Meneses, Y. Auger, S. Chermanne, P. Echegut, Rev. Sci. Instrum. 70, 4020 (1999)
J. Manara, M. Arduini-Schuster, M. Keller, Infrared Phys. Technol. 54, 395 (2011)
J. Lohrengel, R. Todtenhaupt, M. Ragab, Heat. Mass Transf. 28, 321 (1993)
E. Lindermeir, P. Haschberger, V. Tank, H. Dietl, Appl. Opt. 31, 4527 (1992)
J. Dai, X. Wang, G. Yuan, J. Phys. 13, 63 (2005)
K. Zhang, K. Yu, Y. Liu, Y. Zhao, Int. J. Heat. Mass. Transf. 114, 1037 (2017)
R.B. Pérez-Sáez, L.D. Campo, M.J. Tello, J. Int, Thermophysics 29, 1141 (2008)
E.T. Kwor, S. Matteï, High. Temp-high. Press 33, 551 (2001)
J. Song, X. Hao, Z. Yuan, Z. Liu, L. Ding, J. Int, Thermophysics 39, 1 (2018)
F.P. Incropera, A.S. Lavine, T.L. Bergman, D.P. DeWitt, Fundamentals of heat and mass transfer (Wiley, New York, 2007)
C. Monte, J. Hollandt, Metrologia 47, S172 (2010)
A. Adibekyan, High-accuracy spectral emissivity measurement for industrial and remote sensing applications. (2016)
V.I. Sapritsky, A.V. Prokhorov, Metrologia 29, 9 (1992)
B. Rousseau, J. Brun, D.D.S. Meneses, P. Echegut, Int. J. Thermophys. 26, 1277 (2005)
C.P. Cagran, L.M. Hanssen, M. Noorma, A.V. Gura, S.N. Mekhontsev, J. Int, Thermophysics 28, 581 (2007)
L. Wang, S. Basu, Z. Zhang, J. Heat. Transf. 134, 072701 (2012)
K. Zhang, Y. Liu, Appl. Therm. Eng. 168, 114854 (2020)
D.D.S. Meneses, J.F. Brun, Appl. Spectrosc. 58, 969 (2004)
K. Yu, H. Zhang, Y. Liu, Y. Liu, Int. J. Heat. Mass Transf. 129, 1066 (2019)
B. Kong, T. Li, Q. Eri, J. Alloy. Compd. 703, 125 (2017)
L.D. Campo, R.B. Pérez-Sáez, L. González-Fernández, X. Esquisabel, I. Fernández, P. González-Martín, M.J. Tello, J. Alloy. Compd. 489, 482 (2010)
L.D. Campo, R.B. Pérez-Sáez, M.J. Tello, Corros. Sci. 50, 194 (2008)
K. Zhang, K. Yu, Y. Liu, Y. Zhao, Mater. Res. Express. 4, 086501 (2017)
L. Kirkup, R.B. Frenkel, An Introduction to Uncertainty in Measurement Using the GUM (Cambridge University Press, Cambridge, 2006)
Funding
This work is supported by the National Natural Science Foundation of China (Grant Nos. U1804261, 62075058), Innovation Scientists and Technicians Troop Construction Projects of Henan Province (Grant No. 224000510007), Natural Science Foundation of Henan Province (Grant Nos. 222300420011, 222300420209), Key Scientific Research Project of Colleges and Universities in Henan Province (Grant No. 22A140021), Key Scientific and Technological Project of Xinxiang City (Grant No. GG2020002) and Outstanding Youth Foundation of Henan Normal University (Grant No. 20200171).
Ethics declarations
Competing interests
I declare that the authors have no competing interests as defined by Springer, or other interests that might be perceived to influence the results and/or discussion reported in this paper.
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
About this article
Cite this article
Zhang, K., Hu, Q., Yu, K. et al. New Emissivity Measuring System with High Accuracy Under Controlled Environment Conditions. Int J Thermophys 44, 13 (2023). https://doi.org/10.1007/s10765-022-03129-3
Received:
Accepted:
Published:
DOI: https://doi.org/10.1007/s10765-022-03129-3