Abstract
Electrical effects related to insulating leakage represent one of the major factors contributing to uncertainties in measurements using high-temperature standard platinum resistance thermometers (HTSPRTs), especially during the realization of the silver freezing point (\(961.78\,^{\circ }\hbox {C}\)). This work is focused on the evaluation of the differences in resistance measurements observed when using AC resistance bridges and DC resistance bridges, hereafter, termed the AC–DC differences, as the result of various electrical effects. The magnitude of the AC–DC difference in several silver-point cells is demonstrated with several HTSPRTs. The effect of the cell structure on the AC–DC difference is evaluated by exchanging some components, part by part, within a silver-point cell. Then, the effect of the bias voltage applied to the heat pipe within the silver-point furnace is evaluated. Through the analysis of the experimental results and comparison with the reports in the literature, the importance of evaluating the AC–DC difference as a means to characterize the underlying electrical effects is discussed, considering that applying a negative bias condition to the furnace with respect to the high-temperature SPRT can minimize the AC–DC difference. Concluding recommendations are proposed on the components used in silver-point cells and the application of a bias voltage to the measurement circuit to minimize the effects of the electrical leakage.
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D.R. White, M. Ballico, V. Chimenti, S. Duris, E. Filipe, A. Ivanova, A. Kartal Dogan, E. Mendez-Lango, C. Meyer, F. Pavese, A. Peruzzi, E. Renaot, S. Rudtsch, K. Yamazawa, CCT Document CCT08/19/rev, Uncertainties in the Realisation of the SPRT Subranges of the ITS-90 (Bureau International des Poids et Mesures (BIPM), Sèvres, France, 2009)
J. Ancsin, K.D. Hill, Metrologia 30, 507 (1993/94)
D.J. Curtis, G.J. Thomas, Metrologia 4, 184 (1968)
J.P. Evans, J. Res. Nat. Bur. Stand. 89, 349 (1984)
J. Zhang, R.J. Berry, Metrologia 21, 207 (1985)
R.J. Berry, Metrologia 32, 11 (1995)
N.P. Moiseeva, A.I. Pokhodun, B.W. Mangum, G.F. Strouse, in Proceedings of TEMPMEKO ’99, 7th International Symposium on Temperature and Thermal Measurements in Industry and Science, ed. by J.F. Dubbeldam, M.J. de Groot (Edauw Johannissen bv, Delft, 1999), pp. 371–376
N.P. Moiseeva, in Proceedings of TEMPMEKO 2004, 9th International Symposium on Temperature and Thermal Measurements in Industry and Science, ed. by D. Zvizdić, L.G. Bermanec, T. Veliki, T. Stašić (FSB/LPM, Zagreb, Croatia, 2004), pp. 433–438
D.R. White, M. Arai, A. Bittar, K. Yamazawa, Int. J. Thermophys. 28, 1843 (2007)
K. Yamazawa, M. Arai, D.R. White, Int. J. Thermophys. 28, 1855 (2007)
D. Garcia, D. del Campo, F. Raso, Int. J. Thermophys. 32, 1399 (2011)
J.V. Widiatmo, K. Harada, K. Yamazawa, J. Tamba, M. Arai, in Proceedings of Ninth International Temperature Symposium (Los Angeles), Temperature: Its Measurement and Control in Science and Industry, vol. 8, ed. by C.W. Meyer, AIP Conference Proceedings 1552 (AIP, Melville, NY, 2013), pp. 271–276
K. Yamazawa, K. Harada, M. Arai, in Proc. SICE 2002 (Osaka, Japan, 2002), pp. 2469–2472
H. Preston-Thomas, P. Bloombergen, T.J. Quinn, Supplementary Information for the International Temperature Scale of 1990 (Bureau International des Poids et Mesures (BIPM), Sèvres, France, 1990)
H.G. Nubbemeyer, J. Fischer, Metrologia 39, Tech. Suppl. 03001 (2002)
J.V. Widiatmo, K. Harada, K. Yamazawa, M. Arai, Int. J. Thermophys. 29, 158 (2008)
J.V. Widiatmo, K. Harada, K. Yamazawa, J. Tamba, M. Arai, Int. J. Thermophys. 32, 2281 (2011)
K.D. Hill, in Proceedings of TEMPMEKO ’96, 6th International Symposium on Temperature and Thermal Measurements in Industry and Science, ed. by P. Marcarino (Levrotto and Bella, Torino, 1997), pp. 123–128
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Widiatmo, J.V., Harada, K., Yamazawa, K. et al. Electrical Effect in Silver-Point Realization Due to Cell Structure and Bias Voltage Based on Resistance Measurement Using AC and DC Bridges. Int J Thermophys 36, 2002–2026 (2015). https://doi.org/10.1007/s10765-015-1847-x
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DOI: https://doi.org/10.1007/s10765-015-1847-x