Skip to main content
SpringerLink
Log in

Direct Measurement of Vanadium Dioxide Dielectric Properties in W-band

  • Published:
Journal of Infrared, Millimeter, and Terahertz Waves Aims and scope Submit manuscript

Abstract

In this paper we directly measure the refractive index and extinction coefficient of vanadium dioxide (VO2) in W-band (75-110 GHz) near the insulator-to-metal phase transition. A frequency-domain interferometry setup is used to obtain the transmission amplitude and phase shift of a transmitted wave though a 200 nm-thick VO2 film deposited on a silicon substrate. Using the transmission matrix technique, the measured data in the 58-100 °C temperature range are used to obtain the refractive index and extinction coefficient of VO2 as a function of temperature and frequency. The experimental results show a significant increase in the refractive index and extinction coefficient of VO2 beyond the transition temperature of ~68 °C.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5

Similar content being viewed by others

References

  1. M. J. Dicken, K. Aydin, I. M. Pryce, L. A. Sweatlock, E. M. Boyd, S. Walavalkar, J. Ma, and H. A. Atwater, Opt. Express 17, 18330-18339 (2009).

    Article  Google Scholar 

  2. M. A. Kats, R. Blanchard, P. Genevet, Z. Yang, M. M. Qazilbash, D. N. Basov, S. Ramanathan, and F. Capasso, Opt. Lett. 38, 368-370 (2013).

    Article  Google Scholar 

  3. T. Driscoll, S. Palit, M. M. Qazilbash, M. Brehm, F. Keilmann, B.-G. Chae, S.-J. Yun, H.-T. Kim, S. Y. Cho, N. M. Jokerst, D. R. Smith, and D. N. Basov, Appl. Phys. Lett. 93, 024101 (2008).

    Article  Google Scholar 

  4. T. Driscoll, H.-T. Kim, B.-G. Chae, B.-J. Kim, Y.-W. Lee, N. M. Jokerst, S. Palit, D. R. Smith, M. Di Ventra, and D. N. Basov, Science 325, 1518-1521 (2009).

    Article  Google Scholar 

  5. Q.-Y. Wen, H.-W. Zhang, Q.-H. Yang, Y.-S. Xie, K. Chen, and Y.-L. Liu, Appl. Phys. Lett. 97, 021111 (2010).

    Article  Google Scholar 

  6. M. Seo, J. Kyoung, H. Park, S. Koo, H.-S. Kim, H. Bernien, B. J. Kim, J. H. Choe, Y. H. Ahn, H.-T. Kim, N. Park, Q.-H. Park, K. Ahn, and D.-S. Kim, Nano Lett. 10, 2064–2068 (2010).

    Article  Google Scholar 

  7. M. D. Goldflam, T. Driscoll, B. Chapler, O. Khatib, N. M. Jokerst, S. Palit, D. R. Smith, B.-J. Kim, G. Seo, H.-T. Kim, M. Di Ventra, and D. N. Basov, Appl. Phys. Lett. 99, 044103 (2011).

  8. J. Y. Suh, E. U. Donev, D. W. Ferrara, K. A. Tetz, L. C. Feldman, and R. F. Haglund Jr, J. Opt. A: Pure Appl. Opt. 10, 055202 (2008).

    Article  Google Scholar 

  9. D. Y. Lei, K. Appavoo, Y. Sonnefraud, R. F. Haglund Jr., and S. A. Maier, Opt. Lett. 35, 3988-3990 (2010).

    Article  Google Scholar 

  10. D. W. Ferrara, E. R. MacQuarrie, J. Nag, A. B. Kaye, and R. F. Haglund Jr, Appl. Phys. Lett. 98, 241112 (2011).

  11. A. I. Sidorov, J. Opt. Technol. 67, 532-536 (2000).

    Google Scholar 

  12. O. P. Konovalova, A. I. Sidorov, and I. I. Shaganov, J. Opt. Technol. 66, 391-398 (1999).

    Google Scholar 

  13. F. Dumas-Bouchiat, C. Champeaux, A. Catherinot, A. Crunteanu, and P. Blondy, Appl. Phys. Lett. 91, 223505 (2007).

    Article  Google Scholar 

  14. M. Liu, H. Y. Hwang, H. Tao, A. C. Strikwerda, K. Fan, G. R. Keiser, A. J. Sternbach, K. G. West, S. Kittiwatanakul, J. Lu, S. A.Wolf, F. G. Omenetto, X. Zhang, K. A. Nelson, and R. Averitt, Nature 487, 343-348 (2012).

    Google Scholar 

  15. A. Crunteanu, J. Leroy, G. Humbert, D. Ferachou, J.-C. Orlianges, C. Champeaux, and P. Blondy, Proc. IEEE Int. Microwave Symp., Montreal, Canada, 17-22 June (2012).

  16. S. Vegesna, Y. Zhu, Y. Zhao, Z. Fan, A. Bernussi, and M. Saed, Proc. IEEE Int. Microwave Symp., Seattle, WA, 2-7 June (2013).

  17. H. Coy, R. Cabrera, N. Sepúlveda, and F.E. Fernández, J. Appl. Phys. 108, 113115 (2010).

    Article  Google Scholar 

  18. F. J. Morin, Phys. Rev. Lett., 3, 34 (1959).

    Google Scholar 

  19. G. Stefanovich, A. Pergament, and D. Stefanovich, J. Phys.: Condens. Matter., 12, 8837-8845 (2000).

    Google Scholar 

  20. A. Cavalleri, Cs. Tóth, C. W. Siders, J. A. Squire, F. Ráksi, P. Forget, and J. C. Kieffer, Phys. Rev. Lett., 87, 3237401 (2001).

  21. P. J. Hood, and J. F. DeNatale, J. Appl. Phys., 70, 376 (1991).

  22. B. M. Fischer, A. Thomas, H. Helm, J. Y. Suh, R. Lopez, and R. F. Haglund. Jr, Phys. Rev. Lett., 74, 205103 (2006).

    Google Scholar 

  23. W. T. Liu, J. Cao, W. Fan. Z. Hao, M. C. Martin, Y. R. Shen, J. Wu, and F. Wang, Nano Lett., 11, 466-470 (2011).

    Article  Google Scholar 

  24. M. M. Qazilbash, M. Brehm, B. -G. Chae, P. -C. Ho, G. O. Andreev, B. -J. Kim, S. J. Yun, A. V. Balatsky, M. B. Maple, F. Keilmann, H. -T. Kim, and D. N. Basov, Science, 318, 1750-1753 (2007).

    Google Scholar 

  25. J. C. Maxwell Garnett, Philos. Trans. R. Soc. London, 205, 237 (1906).

    Article  Google Scholar 

  26. D. A. G. Bruggeman, Ann. Phys., 24, 636 (1935).

    Google Scholar 

  27. H. W. Verleur, A. S. Barker, and C. N. Berglund, Phys. Rev. 172, 788-798 (1968).

    Google Scholar 

  28. M. Gurvitch, S. Luryi, A. Polyakov, A. Shabalov, M. Dudley, G. Wang, S. Ge, and V. Yakovlev, J. Appl. Phys. 102, 033504 (2007).

    Article  Google Scholar 

  29. J.B. Kana Kana, J.M. Ndjaka, G. Vignaud, A. Gibaud, and M. Maaza, Opt. Commun. 284, 807-812 (2011).

    Google Scholar 

  30. G.-H. Liu, X.-Y. Deng, and R. Wen, J. Mater. Sci. 45, 3270–3275 (2010).

  31. M. Born, and E. Wolf, Principle of Optics, 7th edition, Cambridge (1999).

  32. N. Dávila, R. Cabrera, and N. Sepúlveda, IEEE Photon. Technol. Lett. 24, 1830-1833 (2012).

    Google Scholar 

Download references

Acknowledgements

The authors gratefully acknowledge the financial support from Army Research Office Young Investigator Award (Contract # W911NF-12-1-0253), National Science Foundation (Contract # ECCS-1231314), National Science Foundation Career Award (Contract# ECCS-1139773), and National Science Foundation Graduate Research Fellowship Program (Award# DGE-0802267).

Author information

Authors and Affiliations

  1. Electrical Engineering and Computer Science Department, University of Michigan, Ann Arbor, 1301 Beal Ave, Ann Arbor, MI, 48109, USA

    Mohammed Reza M. Hashemi, Christopher W. Berry & Mona Jarrahi

  2. Electrical Engineering and Computer Science Department, Michigan State University, E. Lansing, 428 S. Shaw Lane, East Lansing, MI, 48824, USA

    Emmanuelle Merced & Nelson Sepúlveda

Authors
  1. Mohammed Reza M. Hashemi
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Christopher W. Berry
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Emmanuelle Merced
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Nelson Sepúlveda
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. Mona Jarrahi
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Mona Jarrahi.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Hashemi, M.R.M., Berry, C.W., Merced, E. et al. Direct Measurement of Vanadium Dioxide Dielectric Properties in W-band. J Infrared Milli Terahz Waves 35, 486–492 (2014). https://doi.org/10.1007/s10762-014-0065-0

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10762-014-0065-0

Keywords

Search

Navigation