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Heating rate dependent delamination of metal–polymer interfaces: experiments and modeling

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Abstract

Bimaterial interfaces in microelectronics packages are the most common regions of failure under thermo-mechanical excursions. In this work, we report experimentally observed role of heating rate on the delamination initiation and propagation across a metal-polymer interface in a microelectronic package. We observe that the rate of delamination propagation increases with increasing heating rate. When the heating rate increases, in addition to the higher amount of delamination growth per unit time, experimental results suggests that higher growth will also incur per unit temperature (loading). Correspondingly, the temperature at which complete delamination occur decreases. Using finite element modeling with cohesive interfaces, we provide a plausible explanation to this observed phenomenon. The analyses indicate that the mechanical behavior of the bimaterial interface is sensitive to both temperature and thermal rate.

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Abbreviations

\(\hbox {G}_{\mathrm{c}}\) :

Area under the softening curve of cohesive zone model

T:

Traction

\(\hbox {T}_{\mathrm{o}}\) :

Peak traction in the bilinear cohesive zone model

\(\upmu \hbox {e}\) :

Microelectronic

\(\theta \) :

Temperature

\(\dot{\theta }\) :

Heating rate

\(\updelta \) :

Separation

References

  • Abaqus (2009) Abaqus Version 6.8 Documentation, ed: Dassault System Simulia Corp

  • Alfano G (2006) On the influence of the shape of the interface law on the application of cohesive-zone models. Compos Sci Technol 66:723–730

    Article  Google Scholar 

  • Colin de Verdiere M, Skordos AA, Walton AC, May M (2012) Influence of loading rate on the delamination response of untufted and tufted carbon epoxy non-crimp fabric composites/Mode II. Eng Fract Mech 96:1–10

    Google Scholar 

  • Costanzo F, Walton JR (2002) Steady growth of a crack with a rate and temperature sensitive cohesive zone. J Mech Phys Solids 50:1649–1679

    Article  Google Scholar 

  • Daoguo Y (2007) Cure-dependent viscoelastic behavior of electronic packaging polymers. Ph.D., Delft Univerisity of Technology, The Netherlands

  • Dávila CG, Camanho PP, Turon A (2008) Effective simulation of delamination in aeronautical structures using shells and cohesive elements. J Aircr 45(2):663–672

    Google Scholar 

  • Fagerström M, Larsson R (2008) A thermo-mechanical cohesive zone formulation for ductile fracture. J Mech Phys Solids 56:3037–3058

    Article  Google Scholar 

  • Geißler G, Kaliske M (2010) Time-dependent cohesive zone modelling for discrete fracture simulation. Eng Fract Mech 77:153–169

    Article  Google Scholar 

  • Hattiangadi A, Siegmund T (2005) A numerical study on interface crack growth under heat flux loading. Int J Solids Struct 42:6335–6355

    Article  Google Scholar 

  • Hu G et al (2007) Experimental and numerical study of the effect of viscoelasticity on delamination in a plastic IC package. In: Proceedings of 57th electronic components and technology conference, 2007. ECTC ’07, pp 1062–1068

  • Huang YE, Hagen D, Dody G, Burnette T (1998) Effect of solder reflow temperature profile on plastic package delamination. Electronics Manufacturing Technology Symposium, 1998. Twenty-Third IEEE/CPMT, 105–111

  • Hutchinson JW, Evans AG (2000) Mechanics of materials: top–down approaches to fracture. Acta Mater 48:125–135

    Article  Google Scholar 

  • Kwon S-C et al (2008) Temperature dependence of fracture toughness of silica/epoxy composites: Related to microstructure of nano- and micro-particles packing. Compos Part B Eng 39:773–781

    Google Scholar 

  • Liu P et al (2003) Interface delamination in plastic IC packages induced by thermal loading and vapor pressure—a micromechanics model. IEEE Trans Adv Packag 26:1–9

    Article  Google Scholar 

  • Mahalingam S (2005) Study of interfacial crack propagation in flip chip assemblies with nano-filled underfill materials. Doctor of Philosophy, G. W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology

  • Ming-Yi T et al (2006) The effect of epoxy molding compound on thermal/residual deformations and stresses in IC packages during manufacturing process. IEEE Trans Compon Packag Technol 29:625–635

    Article  Google Scholar 

  • Mohammed I, Liechti KM (2000) Cohesive zone modeling of crack nucleation at bimaterial corners. J Mech Phys Solids 48:735–764

    Article  Google Scholar 

  • Qu J et al (2003) Thermomechanical reliability of microelectronic packaging. In: Milne I, Ritchie RO, Karihaloo B (eds) Comprehensive structural integrity. Pergamon, Oxford, pp 219–239

  • Raghavan S et al (2011) Methodology to predict substrate warpage and different techniques to achieve substrate warpage targets. IEEE Trans Compon Packag Manuf Technol 1:1064–1074

    Google Scholar 

  • Rosu D et al (2004) An investigation of the thermal degradation of epoxy maleate of bisphenol A. J Anal Appl Pyrolysis 72:191–196

    Article  Google Scholar 

  • Tay AAO, Ma Y, Ong SH, Nakamura T (1999) Measurement of interface toughness as a function of temperature, moisture concentration and mode mixity. Adv Electron Packag 26(2):1129–1136

    Google Scholar 

  • Tvergaard V, Hutchinson JW (1992) The relation between crack growth resistance and fracture process parameters in elastic–plastic solids. J Mech Phys Solids 40:1377–1397

    Article  Google Scholar 

  • van den Bogert WF et al (1988) Thermal stress in semiconductor encapsulating materials. IEEE Trans Compon Hybrids Manuf Technol 11:245–252

    Article  Google Scholar 

  • Volinsky AA et al (2002) Interfacial toughness measurements for thin films on substrates. Acta Mater 50:441–466

    Google Scholar 

  • Volinsky AA et al (2003) Fracture toughness, adhesion and mechanical properties of low-K dielectric thin films measured by nanoindentation. Thin Solid Films 429:201–210

    Google Scholar 

  • Xu C et al (2003a) Rate-dependent crack growth in adhesives: I. Modeling approach. Int J Adhes Adhes 23:9–13

    Article  Google Scholar 

  • Xu C et al (2003b) Rate-dependent crack growth in adhesives II. Experiments and analysis. Int J Adhes Adhes 23:15–22

    Article  Google Scholar 

  • Yeong-Jyh L et al (2011) Modeling of viscoelastic behavior of an epoxy molding compound during and after curing. IEEE Trans Compon Packag Manuf Technol 1:1755–1760

    Article  Google Scholar 

  • Zhu Y et al (2009) Direct extraction of rate-dependent traction-separation laws for polyurea/steel interfaces. Int J Solids Struct 46:31–51

    Article  Google Scholar 

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Acknowledgments

The first author would like to acknowledge the National University of Singapore for providing the PhD scholarship for this research work.

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Correspondence to Siow Ling Ho.

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Appendix: Effect of non-physical parameters

Appendix: Effect of non-physical parameters

The likely spurious effects that may arise from the numerics of the problem will be addressed in this section. Non-physical parameters such as stabilization factor (for viscous regularization damping) or mesh size can have an impact on the delamination propagation. Since the ultimate aim of numerical analyses is typically to predict actual physical behavior, it is important to isolate and eliminate the influence of non-physical behavior on the results obtained from the simulations.

1.1 Stabilization factor

Viscous stabilization is implemented in Abaqus to circumvent convergence difficulties in crack propagation simulations. When the stabilization parameter is sufficiently small, accuracy of results is ensured. Otherwise, toughening of material response will be observed. This suggests that the stabilization factor can have an effect on the results. It will be undesirable if the stabilization factor introduced artificial effects that affect the trends among the simulations. For more information on the viscous stabilization scheme, the reader can refer to (Abaqus 2009; Davila et al. 2008).

The matrix of parameters presented in Table 3 is analysed using the model presented earlier in Sect. 4.1, \(\uprho \) is the stabilization factor while \(\hbox {t}_\mathrm{f}\) is the pseudo-time at maximum load. The results (Fig. 9) show that \(\uprho /\hbox {t}_\mathrm{f}\) (instead of \(\uprho )\) needs to be kept constant to eliminate the impact of viscous stabilization when comparing among delamination at different rates.

Table 3 Parameters of the study on stabilization factor
Fig. 9
figure 9

Effect of stabilization factor

1.2 Mesh size

Mesh can have an effect on the results. To ensure that the mesh used is sufficiently fine to give converged results, a mesh dependence study is performed using the model fast(b) found in Sect. 4.1. The \(\uprho /\hbox {t}_\mathrm{f}\) ratio is kept at 0.208. The results (Fig. 10) show that Mesh 1 (Table 4) is sufficiently fine for the problem. Mesh 1 is used in the analyses presented in Sect. 4.

Fig. 10
figure 10

Results of mesh sensitivity study for heating rate dependent CZM

Table 4 Attributes of mesh at the interface for heating rate dependent CZM

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Ho, S.L., Joshi, S.P. & Tay, A.A.O. Heating rate dependent delamination of metal–polymer interfaces: experiments and modeling. Int J Fract 187, 227–238 (2014). https://doi.org/10.1007/s10704-014-9935-7

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