Abstract
The long-term electrical leakage performance of parylene-C/platinum/parylene-C (Px/Pt/Px) interconnect in saline is evaluated using electrochemical impedance spectroscopy (EIS). Three kinds of additional ceramic encapsulation layers between the metal and Px are characterized: 50 nm-thick alumina (Al2O3), 50 nm-thick titania (TiO2), and 80 nm-thick Al2O3-TiO2 nanolaminate (NL). The Al2O3 and TiO2 encapsulation layers worsen the overall insulation properties. The NL encapsulation layer improves the insulation when combined with a TiO2 outer layer to promote adhesion to the Px. Experiments are performed with various insulation promotion treatments: A-174 silane (A174) treatment before Px deposition (to promote adhesion); SF6 plasma treatment (F) after Px deposition (to increase hydrophobicity); and ion-milling descum (IM) after Px deposition (to prevent parylene oxidation). A174 and F treatments do not have a significant impact, while IM leads to worse insulation performance. A circuit model elucidates the insulation characteristics of Px-ceramic-Pt-ceramic-Px interconnect. These studies provide a foundation for processing ultra-compliant neural probes with long-term chronic utility.
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Acknowledgements
We thank Dr. Matt Moneck and his staff at the Carnegie Mellon Nanofabrication Facility for equipment and process support. This work was sponsored by the Defense Advanced Research Projects Agency (DARPA) ElectRx Program under the auspices of Dr. Doug Weber through the Space and Naval Warfare Systems Center Contract No. HR0011-15-2-0009.
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Forssell, M., Ong, X.C., Khilwani, R. et al. Insulation of thin-film parylene-C/platinum probes in saline solution through encapsulation in multilayer ALD ceramic films. Biomed Microdevices 20, 61 (2018). https://doi.org/10.1007/s10544-018-0307-3
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DOI: https://doi.org/10.1007/s10544-018-0307-3