Abstract
The anodic polarization behavior of alloy Al–17Si–14Mg in borate solutions with and without 0.01 M NaCl was compared to that for pure Al. Results showed that, for the alloy, the passive current density increased but the pitting susceptibility decreased. The first effect was ascribed to a significant electrochemical activity of the Mg2Si intermetallics and the second to improved stability of the oxide film. X-ray photoelectron spectroscopy analysis of potentiostatically formed passive film on the alloy showed that it consisted of aluminum oxyhydroxide with incorporation of silicon in its elemental and two oxidized states (+3 and +4). Mott–Schottky analysis showed that trivalent silicon ion acted as an n-type dopant in the film. The interrelationship between passive film composition, electronic properties, and pitting behavior has been discussed.
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Acknowledgements
The authors are grateful to Conacyt (National Council of Science and Technology, México) for the financial support under grant no. 51303.Y. E. Coral-Escobar is thankful to Universidad del Atlántico (Colombia) for granting the leave of absence to do doctoral research at Cinvestav-Mérida. The authors also thank Dr. P. Bartolo-Pérez for the useful discussions on surface analytical investigations and to Ms. Dora Huerta and W. Cauich for the technical assistance during the analysis by SEM and XPS, respectively.
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Coral-Escobar, E.E., Pech-Canul, M.A. & Pech-Canul, M.I. Electrochemical behavior of passive films on Al–17Si–14Mg (wt.%) alloy in near-neutral solutions. J Solid State Electrochem 14, 803–810 (2010). https://doi.org/10.1007/s10008-009-0853-y
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DOI: https://doi.org/10.1007/s10008-009-0853-y