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Franco Pavese, Alistair B. Forbes (eds.): Data Modeling for Metrology and Testing in Measurement Science

Birkhäuser, Boston, 2009, pp 489 plus DVD, ISBN 978-0-8176-4592-2, Hardback EUR 84.90, USD 109.00

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References

  1. JCGM 100:2008 (2008) Guide to the expression of uncertainty in measurement. www.bipm.org/en/publications/guides/gum.html (also published as ISO/IEC Guide 98–3:1995 (1995) Evaluation of measurement data—Part 3: Guide to the expression of uncertainty in measurement. International Organization for Standardization, Geneva), published in the name of BIPM, IEC, IFCC, ILAC, ISO, IUPAC, IUPAP, OIML

  2. JCGM 200:2008 (2008) International vocabulary of metrology? Basic and general concepts and associated terms (VIM), 3rd edn. www.bipm.org/en/publications/guides/vim.html (also published as ISO/IEC Guide 99:2007 (2007) International vocabulary of metrology? Basic and general concepts and associated terms (VIM). International Organization for Standardization, Geneva) published in the name of BIPM, IEC, IFCC, ILAC, ISO, IUPAC, IUPAP, OIML

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Authors and Affiliations

  1. School of Chemistry, University of New South Wales, Sydney, Australia

    D. Brynn Hibbert

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  1. D. Brynn Hibbert
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Correspondence to D. Brynn Hibbert.

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Hibbert, D.B. Franco Pavese, Alistair B. Forbes (eds.): Data Modeling for Metrology and Testing in Measurement Science. Accred Qual Assur 15, 317–318 (2010). https://doi.org/10.1007/s00769-010-0642-4

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  • DOI: https://doi.org/10.1007/s00769-010-0642-4

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