Quantitative WDXS Microanalysis of Bismuth-Based BaBi₄Ti₄O₁₅ Perovskites Doped with Nb and Fe

Abstract.

 Quantitative electron-probe microanalysis was used to determine the chemical composition of an Fe- and Nb-doped bismuth-based BaBi₄Ti₄O₁₅ perovskite compound. Elemental concentrations of Fe, Nb, Bi, Ba and Ti were accurately measured using wavelength-dispersive X-ray spectroscopy that was optimised for the analysis of a complex oxide matrix containing minor concentrations of dopants. Measurements were performed with a JEOL JXA 840A electron probe microanalyser at 20 and 26 kV, 50 nA beam current, 100 s maximum counting time and 0.3% preset counting deviation (σ_c) using both PET and LiF crystals. K-ratios were quantified by the ZAF and the φ(ρz) PAP matrix-correction procedures. The results showed that dopants incorporate into the BaBi₄Ti₄O₁₅ at Ti^4 + sites according to the Ba_1−4XBi_4 + 4XTi_4−4XFe_4XO₁₅ and Ba_1 + 4XBi_4−4XTi_4−4XNb_4XO₁₅ solid-solution formulae. The majority of the excess charge introduced by the substitution of Ti^4 + with Fe^3 + or Nb^5 + is compensated for the change in the Ba^2 +/Bi^3 + ratio.