Skip to main content
SpringerLink
Log in

Examples of Quantification in XPS on 5f Materials

  • Published:
Microchimica Acta Aims and scope Submit manuscript

Abstract.

 Various aspects of quantification in actinide research using photoelectron spectroscopy are discussed. In particular, the influence of instrumental factors, different types of the background, and shape of the line intensities are addressed. We give several examples of quantitative analysis of actinide bulk compounds and thin films.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

Author information

Authors and Affiliations

  1. European Commission, Joint Research Centre, Institute for Transuranium Elements, Post Box 2340, D-76175 Karlsruhe, Germany, , , , , , DE

    Thomas Gouder & Ladislav Havela

Authors
  1. Thomas Gouder
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Ladislav Havela
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Gouder, T., Havela, L. Examples of Quantification in XPS on 5f Materials. Mikrochim Acta 138, 207–215 (2002). https://doi.org/10.1007/s006040200024

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/s006040200024

Search

Navigation