Abstract
Electrophoretic mobility measurements and X-ray photoelectron spectroscopy (XPS) analysis have been performed on several lanthanum chromite powders with different dopants. Principal component analysis of both deconvoluted XPS data and differentiated overall XPS spectra showed a clustering of the powders. From loading plots it was seen that high amounts of La and O on the surface gave highest isoelectric points (IEP). Partial-least-squares, multivariate response modelling was used to calibrate the IEPs from both deconvoluted XPS data and from differentiated overall XPS spectra. The best model was obtained when second-order differentiated overall XPS spectra were used, with an average predictive error of pH ± 0.25. This is promising considering that the IEP has been determined with an accuracy of pHIEP± 0.3. When deconvoluted data was used, the average predictive error rose to pH ± 1.1. It is therefore an advantage to use multivariate data analysis which is a nonsubjective latent variable decomposing technique in contrast to deconvolution which is an even more time-consuming method for calibration of IEP values from XPS.
Similar content being viewed by others
Author information
Authors and Affiliations
Additional information
Received: 8 October 1998 Accepted in revised form: 27 January 1999
Rights and permissions
About this article
Cite this article
Stakkestad, G., Grung, B., Sjöblom, J. et al. Surface chemistry of lanthanum chromite powders II. Multivariate data modelling of the isoelectric point by the use of surface composition data achieved from X-ray photoelectron spectroscopy measurements. Colloid Polym Sci 277, 627–636 (1999). https://doi.org/10.1007/s003960050434
Issue Date:
DOI: https://doi.org/10.1007/s003960050434