Abstract
Silicon-based plasmon detector is a key component in designing CMOS-compatible integrated plasmonic circuits. Internal-photoemission plasmonic detectors in metal–semiconductor–metal (MSM) structure are promising devices for this purpose, because of their ability to detect infrared wavelengths. In this paper, a balanced MSM-integrated plasmon detector device is proposed to isolate the output from dark current. Performance characteristics of the new device are numerically simulated. In a specific bias point (V = 3 V), the output current is 3.18 × 10−5 A, responsivity is 0.1288 A/W, SNR is 21.7 dB and area is about 2 µm2. Simulation results for this balanced plasmon detector, in comparison with experimental results of previous single-MSM device, demonstrate considerable dark current reduction.
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Rastegar Pashaki, E., Kaatuzian, H., Mallah Livani, A. et al. Design and investigation of a balanced silicon-based plasmonic internal-photoemission detector. Appl. Phys. B 125, 2 (2019). https://doi.org/10.1007/s00340-018-7111-x
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DOI: https://doi.org/10.1007/s00340-018-7111-x