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Broad-band wavelength-interrogated waveguide sensor

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Abstract

A wavelength-interrogated waveguide sensor system with a large wavelength range (≈60 nm) is presented. Dynamic measurements of changes in the refractive index of up to 0.33 refractive index units are demonstrated, without the need for mechanical adjustments during measurements. Furthermore, simultaneous detection of the in-coupling of both TE and TM polarization components is realized, which, for example, could be used for online monitoring of both thickness and refractive index of thin adlayers.

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Authors and Affiliations

  1. Risoe National Laboratory, Optics and Plasma Research Department, P.O. Box 49, 4000, Roskilde, Denmark

    F.D. Nielsen, R. Horvath & H.C. Pedersen

Authors
  1. F.D. Nielsen
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  2. R. Horvath
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  3. H.C. Pedersen
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Corresponding author

Correspondence to H.C. Pedersen.

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PACS

42.79; 07.60

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Nielsen, F., Horvath, R. & Pedersen, H. Broad-band wavelength-interrogated waveguide sensor. Appl. Phys. B 85, 21–24 (2006). https://doi.org/10.1007/s00340-006-2351-6

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  • DOI: https://doi.org/10.1007/s00340-006-2351-6

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