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Structural and optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films prepared by chemical solution methods

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Abstract.

Ferroelectric Bi3.25La0.75Ti3O12 (BLT) thin films have been grown on Pt/Ti/SiO2/Si substrates by chemical solution methods. X-ray diffraction analysis shows that BLT thin films are polycrystalline with (171)-preferential orientation. Atomic force microscopy investigation shows that they have large grains about 120 nm in size. A Pt/BLT/Pt capacitor has been fabricated and showed excellent ferroelectricity, with a remnant polarization and coercive field of 24 μC/cm2 and 116 kV/cm, respectively. The capacitor shows no polarization fatigue up to 109 switching cycles. The optical constants (n,k) of the BLT thin films in the wavelength range 0.35–1.7 μm were obtained by spectroscopic ellipsometry measurements, and the band-gap energy was found to be about 3.25 eV.

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Authors and Affiliations

  1. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083 Shanghai, P.R. China, , , , , , CN

    G.S. Wang, X.J. Meng, Z.Q. Lai, J. Yu, J.L. Sun, S.L. Guo & J.H. Chu

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  1. G.S. Wang
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  2. X.J. Meng
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  3. Z.Q. Lai
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  4. J. Yu
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  5. J.L. Sun
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  6. S.L. Guo
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  7. J.H. Chu
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Received: 16 October 2001 / Accepted: 6 January 2002 / Published online: 3 June 2002

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ID="*"Corresponding author. Fax: +86-21/65830-734, E-mail: gswang@mail.sitp.ac.cn

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Wang, G., Meng, X., Lai, Z. et al. Structural and optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films prepared by chemical solution methods . Appl Phys A 76, 83–86 (2003). https://doi.org/10.1007/s003390201305

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  • DOI: https://doi.org/10.1007/s003390201305

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