Scanning probe microscopies, nanoscience and nanotechnology

Abstract.

The symbiotic relationship between nanoscience and nanotechnology and the scanning probe microscopies is analyzed in terms of relating non-contact atomic force microscope (NC-AFM) technology to applications requiring detection, manipulation and fabrication on the molecular scale. The features of NC-AFM in this connection, which facilitate its unique relationship with nanoscale science and technology, are discussed. Specific typical examples are presented of applications where a NC-AFM measurement of a specific physical or chemical property is correlated with position, orientation or location on the atomic scale.