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Received: 3 July 1998
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Tang, M., Chen, Y., Wang, J. et al. Combined electric field and near-field scanning optical microscopy: modification of silicon surfaces . Appl Phys A 68, 177–180 (1999). https://doi.org/10.1007/s003390050874
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DOI: https://doi.org/10.1007/s003390050874